Quick selection table

Type Application Force constant
[N/m]
Resonance
frequency
[kHz]
Coatings Special tip versions
Contact qp-CONT   Contact Mode ,
Biological Applications
0.1 30 partial Au ---
qp-SCONT   Soft Contact Mode ,
Biological Applications
0.01 11 partial Au ---
qp-BioAC  
3 cantilevers
Non-Contact / Tapping Mode ,
Biological Applications ,
Contact Mode
CB1: 0.3
CB2: 0.1
CB3: 0.06
CB1: 90
CB2: 50
CB3: 30
partial Au ---
qp-BioT  
2 cantilevers
Non-Contact / Tapping Mode ,
Biological Applications ,
Contact Mode
CB1: 0.08
CB2: 0.3
CB1: 20
CB2: 50
partial Au ---
PtSi-CONT   Contact Mode ,
Electrostatic Force Microscopy/ Electrical Measurement
0.2 13 PtSi (reflective) Platinum Silicide
ATEC-CONT   Contact Mode 0.2 15 Au, PtIr5
(optional)
---
PPP-CONT   Contact Mode 0.2 13 Reflex, AuD, Au, PtIr5, PtSi
(optional)
DT, CDT, RT, TL
PPP-CONTSC   Contact Mode
(short cantilever)
0.2 25 Reflex, AuD, Au, PtIr5
(optional)
---
PPP-XYCONTR   Contact Mode 0.2 13 Reflex ---
TL-CONT   Contact Mode 0.2 13 --- Tipless
PL2-CONT   Contact Mode 0.2 13 Reflex
(optional)
Plateau
PPP-ZEILR   Contact Mode
(Seiko or Zeiss Veritect)
1.6 27 Reflex ---
Non-contact qp-BioAC  
3 cantilevers
Non-Contact / Tapping Mode ,
Biological Applications ,
Contact Mode
CB1: 0.3
CB2: 0.1
CB3: 0.06
CB1: 90
CB2: 50
CB3: 30
partial Au ---
qp-BioT  
2 cantilevers
Non-Contact / Tapping Mode ,
Biological Applications ,
Contact Mode
CB1: 0.08
CB2: 0.3
CB1: 20
CB2: 50
partial Au ---
PtSi-NCH   Non-Contact / Tapping Mode ,
Electrostatic Force Microscopy/ Electrical Measurement
42 330 PtSi (reflective) Platinum Silicide
ATEC-NC   Non-Contact / Tapping Mode 45 335 Au, PtIr5
(optional)
---
PPP-NCH   Non-Contact / Tapping Mode
(high frequency)
42 330 Reflex, AuD, Au, PtIr5, PtSi
(optional)
SSS, AR5T, AR5, AR10T, AR10, DT, CDT, RT, TL
PPP-XYNCHR   Non-Contact / Tapping Mode
(high frequency)
42 330 Reflex ---
PPP-QNCHR   Non-Contact / Tapping Mode
(high frequency, high quality factor)
42 330 Reflex ---
TL-NCH   Non-Contact / Tapping Mode 42 330 --- Tipless
PL2-NCH   Non-Contact / Tapping Mode
(high frequency)
42 330 Reflex
(optional)
Plateau
PPP-NCL   Non-Contact / Tapping Mode
(long cantilever)
48 190 Reflex, AuD, Au
(optional)
SSS, AR5, DT, CDT, TL
TL-NCL   Non-Contact / Tapping Mode
(long cantilever)
48 190 --- Tipless
PL2-NCL   Non-Contact / Tapping Mode
(long cantilever)
48 190 Reflex
(optional)
Plateau
PPP-NCST   Non-Contact / Soft Tapping Mode 7.4 160 Reflex, AuD, Au, PtIr5
(optional)
---
PPP-SEIH   Non-Contact / Tapping Mode
(Seiko or Zeiss Veritect)
15 130 Reflex
(optional)
SSS
Special ATEC-FM   Force Modulation Mode 2.8 85 Au
(optional)
---
PtSi-FM   Electrostatic Force Microscopy/ Electrical Measurement 2.8 75 PtSi (reflective) Platinum Silicide
PPP-LFMR   Contact Mode ,
Lateral / Friction Force Microscopy
0.2 23 Reflex ---
PPP-FM   Force Modulation Mode 2.8 75 Reflex, AuD, Au, PtSi, PtIr5
(optional)
DT, CDT, RT, TL
PPP-QFMR   Force Modulation Mode
(high quality factor)
2.8 75 Reflex ---
TL-FM   Force Modulation Mode 2.8 75 --- Tipless
PL2-FM   Force Modulation Mode 2.8 75 Reflex
(optional)
Plateau
PPP-EFM   Electrostatic Force Microscopy/ Electrical Measurement 2.8 75 PtIr5 ---
PPP-MFMR   Magnetic Force Microscopy 2.8 75 Hard Magnetic, Reflex SSS
PPP-LM-MFMR   Magnetic Force Microscopy
(low moment)
2.8 75 Hard Magnetic, Reflex ---
PPP-LC-MFMR   Magnetic Force Microscopy
(low coercivity)
2.8 75 Soft Magnetic, Reflex ---
PPP-QLC-MFMR   Magnetic Force Microscopy
(low coercivity, high quality factor)
2.8 75 Soft Magnetic, Reflex ---
SSS-MFMR   Magnetic Force Microscopy
(high resolution)
2.8 75 Hard Magnetic, Reflex SSS
SSS-QMFMR   Magnetic Force Microscopy
(high resolution, high quality factor)
2.8 75 Hard Magnetic, Reflex SSS
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