PointProbe® Plus XY-Alignment AFM-Probe
PPP-XYNCHR
- Non-Contact High frequency
- Backside Reflex coating
PPP-NCLR
- Non-Contact Long cantilever
- Backside Reflex coating
PPP-NCL
- Non-Contact Long cantilever
PPP-NCLAuD
- Non-Contact Long cantilever
- Au coating on detector side
PPP-SEIHR
- for Seiko Instruments microscope
- Backside Reflex coating
XY-Alignment Compatible SuperSharpSilicon™ Types
SSS-NCL
- Non-Contact Long cantilever
SSS-SEIH
- for Seiko Instruments microscope
SSS-NCLR
- Non-Contact Long cantilever
- Backside Reflex coating
SSS-SEIHR
- for Seiko Instruments microscope
- Backside Reflex coating
XY-Alignment Compatible High Aspect Ratio Probe Types
AR5-NCLR
- High Aspect Ratio Tip
- Aspect Ratio ≥ 5:1
- Non-Contact Long cantilever
- Backside Reflex coating
XY-Alignment Compatible Coated Probe Types
DT-NCLR
- Non-Contact Long cantilever
- Diamond Coated Tip
- Backside Reflex coating
PPP-NCLAu
- Non-Contact Long cantilever
- Au coating (both sides)
XY-Alignment Compatible Tipless Cantilever Probe Types
TL-NCL
- Non-Contact Long cantilever