PointProbe® Plus SEIKO microscopes - Non-Contact /Tapping Mode High Force Constant
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).
The probe offers unique features:
- guaranteed tip radius of curvature < 10 nm
- tip height 10 - 15 µm
- highly doped silicon to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity