PPP-SEIH

PointProbe® Plus SEIKO microscopes - Non-Contact /Tapping Mode High Force Constant

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).

The probe offers unique features:

  • guaranteed tip radius of curvature < 10 nm
  • tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
How to optimize AFM scanning parameters: list-img
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 130 96 - 175
Force Constant [N/m] 15 5 - 37
Length [µm] 225 215 - 235
Mean Width [µm] 33 25 - 40
Thickness [µm] 5 4 - 6
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-SEIH-10 10 of all probes
PPP-SEIH-20 20 of all probes
PPP-SEIH-50 50
PPP-SEIH-W 380 of up to 32 probes
NANOSENSORS™ PointProbe® Plus AFM Probes