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SSS-QMFMR

SuperSharpSilicon™ - High Quality-Factor - Magnetic Force Microscopy - Reflex Coating

The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated tip, a high aspect ratio at the last few hundred nanometers of the tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.

Due to the low magnetic moment of the tip the sensitivity to magnetic forces is decreased if compared to standard MFM probe but the disturbance of soft magnetic samples is also reduced.

The hard magnetic coating on the tip is characterized by a coercivity of app. 125 Oe and a remanence magnetization of app. 80 emu/cm3 (these values were determined on a flat surface).

The SPM probe offers unique features:

As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
SSS-QMFMR-10 10 of all probes hard magnetic and reflex
SSS-QMFMR-W >370 of up to 32 probes hard magnetic and reflex


Product screencast NANOSENSORS™ Magnetic Force Microscopy MFM Silicon Probes

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