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PPP-QFMR

PointProbe® Plus - High Quality-Factor - Force Modulation Mode - Reflex Coating

The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius (typical tip radius less than 7 nm) as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode under UHV conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
Quality Factor 30000 30000 - 50000

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PPP-QFMR-10 10 of all probes reflex


Product screencast NANOSENSORS™ PointProbe® Plus AFM Probes

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