Tag Archives: Conductive AFM (CAFM)

Hall effect in charged conducting ferroelectric domain walls

In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls.
NANOSENSORS PPP-EFM AFM tips were used for the measurements in this paper.

from: Campbell M. P. et al., Hall effect in charged conducting ferroelectric domain walls, Figure 1: Piezoresponse and conductive analysis of domain structure in YbMnO3.
from: Hall effect in charged conducting ferroelectric domain walls, Figure 1: Piezoresponse and conductive analysis of domain structure in YbMnO3.

Campbell M. P. et al. Hall effect in charged conducting ferroelectric domain walls. Nat. Commun. 7, 13764 doi: 10.1038/ncomms13764 (2016)

For the full article please follow this external link: https://www.nature.com/articles/ncomms13764

Creative CommonsThe article “Hall effect in charged conducting ferroelectric domain walls”  by Campbell M. P. et al. is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)

Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese.

NANOSENSORS™ Platinum Silicide AFM probes are designed for conductive AFM imaging where the combination of excellent conductivity, high wear resistance and a small tip radius is required. Platinum Silicide AFM tips are made of highly conductive platinum silicide which unites high conductivity (higher than conductive diamond coating and as good as metal coated tips) with a high wear resistance (much higher than metal coated probes and almost as good as diamond coated probes). Additionally the new PtSi probes have a slightly decreased tip radius compared to standard metal coated AFM probes. They can be used for any kind of electric or electrostatic AFM measurement, except SSRM.

– Hard, solid and conductive silicide apex
– Smaller tip radius (nominal 25nm) than normal metal coated probes (nominal 30nm). About five to six times smaller radius when – compared to diamond coated tips (nominal 150nm)
– Almost metal like conductivity.
– high wear resistance compared to silicon and PtIr coated tips

NANOSENSORS™ Platinum Silicide probes are ideally suited for
– Conductive AFM (CAFM)
– Tunneling AFM (TUNA)
– Scanning Capacitance Microscopy (SCM)
– Kelvin Probe Force Microscopy (KPFM)
– Electrostatic Force Microscopy (EFM)