Tag Archives: AFM

Low Interaction Force Imaging with NANOSENSORS™ Heartbeat Cantilevers


A thin and very flexible polymer lamella with a high aspect ratio should be characterized by Atomic Force Microscopy. When imaged in Tapping Mode, we can see that the position of the lamella in trace- and retrace-images is shifted (figures 3 and 4). The lamella is dragged by the tip towards the scan direction and slips away (see figure 7). Of course, those images do not represent the true structure of the surface. To avoid this “drag-and-slip” effect the lamella was imaged with a NANOSENSORS™ Heartbeat Cantilever in a low force interaction mode (ScanAsyst®, figures 5 and 6). When overlaying cross-sections from trace and retrace of the images it becomes clear that the NANOSENSORS™ Heartbeat Cantilever images are superimposable and depict the sample precisely (figure 8).ScnAsstLmll_fig34


2016 Kavli Prize in Nanoscience Awarded to Gerd Binnig, Christoph Gerber, Calvin Quate for Invention of AFM

Gerd Binning, Christoph Gerber and Calvin Quate have been awarded the 2016 Kavli Prize in Nanoscience for the invention of the Atomic Force Microscope (AFM).


Magnetic image (phase shift) of an experimental hard disk measured with a NANOSENSORS SSS-MFMR AFM probe
Magnetic image (phase shift) of an experimental hard disk with varied bit length (courtesy of Maxtor) measured with a NANOSENSORS SSS-MFMR AFM probe

NANOSENSORS PointProbePlusプローブ

いくださいとお勧めするのは「シリコン標準プローブ PointProbe®Plus」。「標準」

PointProbe Plus AFM tip front view
NANOSENSORS PointProbe Plus AFM probe front view