In this application image we used the small cantilever of the NANOSENSORS™ uniqprobe^® BioT to scan in ScanAsyst^® mode in air. We imaged crystallites with nanometer-sized edge features with a scan size of 1 µm and a speed of 2 µm/s. Even in a that large, micrometer size image of a surface with a distinct topography, feature sizes of 5 nm and below are clearly visible. ScanAsyst^® is a registered trademark of Bruker Corp.

http://www.nanosensors.com/pdf/NANOSENSORS-uniqprobe-brochure.pdf

Visit us at Toyo booth  4B-705 at JASIS 2015 in Makuhari, Japan this week.

The NANOSENSORS screencast on SuperSharp Silicon AFM tips for high resolution imaging is now available in Chinese on youtube  and youku http://v.youku.com/v_show/id_XOTIzNjg0NDQ0.html .

NANOSENSORS公司的吴烨娴博士在本视频中介绍了SuperSharpSilicon原子力显微镜探针。SSS超尖硅针尖是为超高精度的原子力显微 镜成像设计的。它适用于超精细结构，如小于10nm特征粗糙度表面的测量。该探针基于NANOSENSORS的标准AFM探针 PointProbePlus系统。在一个特殊的尖端锐化过程后，针尖半径由7nm减小为2nm。 其针尖的半锥角小于12°， 最末端的150至200纳米针尖的长径比优于4比1。

这种探针非常适合测量小于100nm特征尺度的沟道或微小孔隙 。NANOSENSORS 的SuperSharpSilicon探针可集成在不同的悬臂类型中，以适应不同的测量模式，其中包括非接触模式，声波或轻敲模式，力调制模式等。