原子力显微镜探针

Happy New Lunar Year!

by NANOSENSORS
10 February 202115 March 2023
News & Events

NANOSENSORS wishes you all a happy and successful year of the cow. Shiloutte of cows climbing up a hill.

We wish everyone a good start into the year of the bull/ox/cow!

In‐situ force measurement during nano‐indentation combined with Laue microdiffraction

by NANOSENSORS
22 January 202115 March 2023
Science & Technology

image of a tuning fork based NANOSENSORS self-sensing and self-actuating Akiyama-probe (A-probe)

A NANOSENSORS™ self-sensing self-activating Akiyama probe was used in a home-built Scanning Probe Microscope for this interesting research article. *Florian Lauraux, Sarah Yehya, Stéphane Labat,… Read More »In‐situ force measurement during nano‐indentation combined with Laue microdiffraction

Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

by NANOSENSORS
5 October 202015 March 2023
Science & Technology

Figure 5. from “Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles” by Huan Fei Wen et al. (a) Frequency shift (∆f) image, (b) tunneling current () image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles. (a) Frequency shift (∆f) image, (b) tunneling current () image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). - Ultrastiff NANOSENSORS SD-T10L100 AFM probes were used.

In the article “Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy” Huan Fei Wen, Yasuhiro Sugawara and Yan Jun describe how… Read More »Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

Plant-Based Scaffolds Modify Cellular Response to Drug and Radiation Exposure Compared to Standard Cell Culture Models

by NANOSENSORS
7 September 202015 March 2023
Science & Technology

Plant-based scaffolds present many advantages over a variety of biomaterials.* Recent studies explored their potential to be repopulated with human cells and thus highlight a… Read More »Plant-Based Scaffolds Modify Cellular Response to Drug and Radiation Exposure Compared to Standard Cell Culture Models

Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

by NANOSENSORS
6 August 202015 March 2023
Inside NANOSENSORS, News & Events, Videos

The screencast on the soft, drift-reduced NANOSENSORS™ uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 1000… Read More »Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 1000 views mark

Happy Swiss National Holiday with Smallest Swiss Cross

by NANOSENSORS
1 August 202015 March 2023
News & Events

Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PointProbePlus PPP-NCL AFM probe was used for this image)

Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy

by NANOSENSORS
26 July 202015 March 2023
Science & Technology

Figure 2 from «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» by Kohei Ono et al: Atomic force microscopy (AFM) mag image (a), slope mapping (b), and adhesion force mapping (c) obtained from the same 1 μm PSL particle. Representative force–distance curves are shown for the point at which the tip is properly in contact with the surface with sufficient stroke (loading force), at the proper angle (d) and for the point further towards the edge where the tip is barely touching the surface at a steep angle (e). The black lines in panels (d) and (e) show the baseline in which the tip did not touch the particle or substrate. A plot of the relationship between the slope and the adhesion force is shown in panel (f). The plots in the shaded area are considered to represent the adhesion force of the particle.

In the article «Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy» Kohei Ono, Yuki Mizushima, Masaki Furuya, Ryota Kunihisa, Nozomu… Read More »Direct Measurement of Adhesion Force of Individual Aerosol Particles by Atomic Force Microscopy