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Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

In the article “Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy” Huan Fei Wen, Yasuhiro Sugawara and Yan Jun describe how they studied the O2 dissociated state under the different O2 exposed temperatures with atomic resolution by scanning probe microscopy (SPM) and imaged the O adatom by simultaneous atomic force microscopy (AFM)/scanning tunneling microscopy (STM).*

The effect of AFM operation mode on O adatom contrast was investigated, and the interaction of O adatom and the subsurface defect was observed by AFM/STM. Multi-channel exploration was performed to investigate the charge transfer between the adsorbed O and the TiO2(110) by obtaining the frequency shift, tunneling current and local contact potential difference at an atomic scale. The tunneling current image showed the difference of the tunneling possibility on the single O adatom and paired O adatoms, and the local contact potential difference distribution of the O-TiO2(110) surface institutively revealed the charge transfer from TiO2(110) surface to O adatom. The experimental results are expected to be helpful in investigating surface/interface properties by SPM. *

Iridium-coated ultrastiff AFM cantilever SD-T10L100 from the NANOSENSORS Special Developments List (typical Force constant 2 000 N/m) were used in the presented study.

The cantilever tip was first degassed at approximately 650 K for 30 min and then cleaned by Ar ion bombardment to remove the contaminants, prior to the measurements. Features of the surface structure were related to the charge states of the tip apex, and a stable tip was essential to accurately characterize the surface structure and properties in the experiment. The imaging mode became stable in AFM experiments when the metal-coated Si cantilever was employed in the experiments. *

Figure 5. from “Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles” by Huan Fei Wen et al. - Iridium coated NANOSENSORS SD-T10L100 AFM probes were used
(a) Frequency shift (∆f) image, (b) tunneling current (<It>) image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles. (a) Frequency shift (∆f) image, (b) tunneling current (<It>) image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2).

Figure 5. from “Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles” by Huan Fei Wen et al.
(a) Frequency shift (∆f) image, (b) tunneling current (<It>) image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2). Multiple images of TiO2(110) surface with atomic resolution and corresponding line profiles. (a) Frequency shift (∆f) image, (b) tunneling current (<It>) image and (c) local contact potential difference (VLCPD) image. (d,e) The line profiles along the blue line on the surface in (b,c). (f0 = 805 kHz, Q = 27623, ∆f = −260 Hz, VDC = 1.3 V, VAC = 1.5 V, A = 500 pm, size: 3.5 × 3.2 nm2).

*Huan Fei Wen, Yasuhiro Sugawara and Yan Jun
Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy
Nanomaterials 2020, 10(8), 1506
DOI: https://doi.org/10.3390/nano10081506

Please follow this external link to read the full article: https://www.mdpi.com/2079-4991/10/8/1506/htm

More articles mentioning the use of NANOSENSORS ultrastiff AFM probes:

Yuuki Adachi, Huan Fei Wen, Quanzhen Zhang, Masato Miyazaki, Yasuhiro Sugawara and Yan Jun Li
Elucidating the charge state of an Au nanocluster on the oxidized/reduced rutile TiO2 (110) surface using non-contact atomic force microscopy and Kelvin probe force microscopy
Nanoscale Adv., 2020, 2, 2371-2375 (Paper)
DOI: 10.1039/C9NA00776H
https://pubs.rsc.org/en/content/articlehtml/2020/na/c9na00776h

Huan Fei Wen, Hongqian Sang Yasuhiro Sugawara, and Yan Jun Li
Dynamic behavior of OH and its atomic contrast with O adatom on the Ti site of TiO2(110) at 78 K by atomic force microscopy imaging
Appl. Phys. Lett. 117, 051602 (2020)
DOI: https://doi.org/10.1063/5.0016657

Yuuki Adachi, Yasuhiro Sugawara, and Yan Jun Li
Remotely Controlling the Charge State of Oxygen Adatoms on a Rutile TiO2(110) Surface Using Atomic Force Microscopy
J. Phys. Chem. C 2020, 124, 22, 12010–12015
DOI: https://doi.org/10.1021/acs.jpcc.0c03117

Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Masato Miyazaki, Yasuhiro Sugawara, Yan JunLi
Contrast inversion of O adatom on rutile TiO2(1 1 0)-(1 × 1) surface by atomic force microscopy imaging
Applied Surface Science Volume 505, 1 March 2020, 144623
DOI: https://doi.org/10.1016/j.apsusc.2019.144623

Open Access The article “Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy” by Huan Fei Wen, Yasuhiro Sugawara and Yan Jun is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

Correlating data from different microscopy techniques holds the potential to discover new facets of signalling events in cellular biology.*

In the article “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences” Ana I. Gómez-Varela, Dimitar R. Stamov, Adelaide Miranda, Rosana Alves, Cláudia Barata-Antunes, Daphné Dambournet, David G. Drubin, Sandra Paiva and Pieter A. A. De Beule report for the first time a hardware set-up capable of achieving simultaneous co-localized imaging of spatially correlated far-field super-resolution fluorescence microscopy and atomic force microscopy, a feat only obtained until now by fluorescence microscopy set-ups with spatial resolution restricted by the Abbe diffraction limit.*

The authors detail system integration and demonstrate system performance using sub-resolution fluorescent beads and applied to a test sample consisting of human bone osteosarcoma epithelial cells, with plasma membrane transporter 1 (MCT1) tagged with an enhanced green fluorescent protein (EGFP) at the N-terminal.*

The simultaneous operation of AFM and super-resolution fluorescence microscopy technique provides a powerful observational tool on the nanoscale, albeit data acquisition is typically obstructed by a series of integration problems. The authors of the above-mentioned article believe that the combination of SR-SIM with AFM presents one of the most promising schemes enabling simultaneous co-localized imaging, allowing the recording of nanomechanical data and cellular dynamics visualization at the same time.*

For measurements on cells in liquid NANOSENSORS™ uniqprobe qp-BioAC-CI AFM probes ( CB1 ) with a nominal resonance frequency of 90 kHz (in air), spring constant of 0.3 Nm−1, partial gold coating on the detector side, and quartz-like circular symmetric hyperbolic (double-concaved) tips with ROC of 30 nm were used. The corresponding AFM areas for the cell images were acquired with a Z-cantilever velocity of 250 μms−1 at a max Z-length of 1.5 μm, resulting in an acquisition time (based on the number of pixels) for Figs. 2, 3, 4 of ca. 13, 8 and 15 min respectively.*

Figure 4 a and b from Ana I. Gómez-Varela et al “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences :  Simultaneous SR-SIM/AFM acquisition. The AFM measurements were carried out on fixed U2OS cells in medium/buffer with (a) and without N-SIM illumination (b). For convenience and enhanced feature/noise contrast, both AFM topography images in the SR-SIM/AFM overlays are displayed with an edge detection algorithm using a pixel difference operator in X. The topography images from Petri dish surface on three positions (labelled in the figures) were planefit (1st order polynomial function) to compensate for tilts in the sample surface, and subjected to surface roughness analysis Please have a look at the full article to view the full figure. https://rdcu.be/b4Iot
Figure 4 a and b from Ana I. Gómez-Varela et al “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences : Simultaneous SR-SIM/AFM acquisition. The AFM measurements were carried out on fixed U2OS cells in medium/buffer with (a) and without N-SIM illumination (b). For convenience and enhanced feature/noise contrast, both AFM topography images in the SR-SIM/AFM overlays are displayed with an edge detection algorithm using a pixel difference operator in X. The topography images from Petri dish surface on three positions (labelled in the figures) were planefit (1st order polynomial function) to compensate for tilts in the sample surface, and subjected to surface roughness analysis. Please have a look at the full article to view the full figure. https://rdcu.be/b4Iot

*Ana I. Gómez-Varela, Dimitar R. Stamov, Adelaide Miranda, Rosana Alves, Cláudia Barata-Antunes, Daphné Dambournet, David G. Drubin, Sandra Paiva and Pieter A. A. De Beule
Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences
Nature Scientific Reports volume 10, Article number: 1122 (2020)
DOI: https://doi.org/10.1038/s41598-020-57885-z

Please follow this external link to read the full article https://rdcu.be/b4Iot

Open Access: The article “Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences” by Ana I. Gómez-Varela, Dimitar R. Stamov, Adelaide Miranda, Rosana Alves, Cláudia Barata-Antunes, Daphné Dambournet, David G. Drubin, Sandra Paiva and Pieter A. A. De Beule is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.