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News & Events

NANOSENSORS’ official announcements and participation at exhibitions and trade shows

Tipless cantilever arrays – Special Development List updated

NANOSENSORS Special Development List has been updated with completely new items: Tipless cantilevers arrays (qp-TL8) based on uniqprobe – uniform quality probe – technology. Similar to the uniqprobe cantilevers (i.e. qp-CONT), the cantilevers of these new arrays show an outstanding uniformity of their thicknesses leading to a strongly reduced dispersion of force constants and resonance frequenices compared with standard silicon cantilever arrays.

tl8-1

Read More »Tipless cantilever arrays – Special Development List updated

Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available

NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

Read More »Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available

NANOSENSORS™ introduces new uniqprobe series – uniform quality SPM probes

SEM image of an uniqprobe cantilever.
SEM image of an uniqprobe cantilever.

SEM image of an uniqprobe cantilever.

The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

Read More »NANOSENSORS™ introduces new uniqprobe series – uniform quality SPM probes

NanoInk® compatible Silicon Nitride AFM Probe Arrays available from NANOSENSORS Special Developments List

NANOSENSORS™ Nanoink® compatible Silicon Nitride Arrays
NANOSENSORS™ Nanoink® compatible Silicon Nitride Arrays

NANOSENSORS™ Nanoink® compatible
Silicon Nitride Arrays

NANOSENSORS™ develops many AFM tip varieties that are not commercialized as standard products but still are available on demand. We call these customized products “Special Developments”.

Among these Special Developments are also some Silicon Nitride AFM Probe Arrays that among other applications can also be used as DPN pens and are therefore compatible with some NanoInk® instruments.

Read More »NanoInk® compatible Silicon Nitride AFM Probe Arrays available from NANOSENSORS Special Developments List

NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series

NANOSENSORS™ announced that the first two types of a new innovative SPM probes series of wear resistant and highly conductive AFM tips will be introduced today.

The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.

Read More »NANOSENSORS™ introduces new Wear Resistant Conductive AFM Probe Series