NANOSENSORS’ official announcements and participation at exhibitions and trade shows
The NANOSENSORS screencast on SuperSharp Silicon AFM tips for high resolution imaging is now available in Chinese on youtube and youku http://v.youku.com/v_show/id_XOTIzNjg0NDQ0.html . NANOSENSORS公司的吴烨娴博士在本视频中介绍了SuperSharpSilicon原子力显微镜探针。SSS超尖硅针尖是为超高精度的原子力显微 镜成像设计的。它适用于超精细结构，如小于10nm特征粗糙度表面的测量。该探针基于NANOSENSORS的标准AFM探针 PointProbePlus系统。在一个特殊的尖端锐化过程后，针尖半径由7nm减小为2nm。… Read More »视频介绍 – SuperSharpSilicon原子力显微镜探针 – NANOSENSORS™
NANOSENSORS has added a new type of rounded AFM tips to the Special Development List. The new rounded AFM tips SD-R30 have a typical tip… Read More »Rounded AFM Tips for Nanomechanics and Force Spectroscopy – Special Development List updated
Our product screencast on the Platinum Silicide AFM Probes series from NANOSENSORS™ is now available in Japanese. NANOSENSORS™ Platinum Silicide AFM probes are designed for… Read More »Product Screencast NANOSENSORS™ Platinum Silicide AFM probes (Japanese – 日本語)
Learn more about the NANOSENSORS uniqprobes for biology and life science applications at the NanoAndMore booth no. 469 at the Biophysics Meeting in Baltimore this… Read More »Visit our distributor NanoAndMore USA at booth no. 469 at Biophys
NANOSENSORS Special Development List has been updated with completely new items: Tipless cantilevers arrays (qp-TL8) based on uniqprobe – uniform quality probe – technology. Similar to the uniqprobe cantilevers (i.e. qp-CONT), the cantilevers of these new arrays show an outstanding uniformity of their thicknesses leading to a strongly reduced dispersion of force constants and resonance frequenices compared with standard silicon cantilever arrays.
Read More »Tipless cantilever arrays – Special Development List updated
Please visit us at NanoAndMore USA booth no. 610 at MRS Fall #F14mrs to learn more about our drift reduced uniqprobes for biology and life-science.
NANOSENSORS™ announced that now all three basic types of the new innovative SPM probes series of wear resistant and highly conductive AFM tips are available.
The new AFM probes feature the best of both worlds of the most commonly used conductive probes for Atomic Force Microscopy (AFM): metal coated probes and probes with conductive diamond coating.
Read More »Platinum Silicide Probes for Contact Mode (PtSi-CONT) are now available