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NANOSENSORS

NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.

Rapid access to discrete and monodisperse block co-oligomers from sugar and terpenoid toward ultrasmall periodic nanostructures

Fig. 4 from : Rapid access to discrete and monodisperse block co-oligomers from sugar and terpenoid toward ultrasmall periodic nanostructures by Takuya Isono et al. Thin-film morphologies of Glc3-b-Sol and Glc4-b-Sol. AFM height images (a, b) and corresponding cross-sectional profiles (c, d) indicating the formation of 6–8-nm-thick horizontal lamellae in Glc3-b-Sol (a, c) and Glc4-b-Sol thin films (b, d). Thin-film samples were prepared by spin-coating the BCO solution onto the hydrophilic surface of a silicon substrate followed by thermal annealing at 85 °C for 1 h. NANOSENSORS PointProbe Plus PPP-NCHR standard silicon tapping mode AFM probes and NANOSENSORS SuperSharpSilicon high resolution silicon AFM probes were used

Discrete block co-oligomers (BCOs) can form highly ordered ultrasmall nanostructures which can be used for lithographic templates. These nanotemplates are promising for the low-cost, large-scale,… Read More »Rapid access to discrete and monodisperse block co-oligomers from sugar and terpenoid toward ultrasmall periodic nanostructures

AFM probes for high resolution imaging – NANOSENSORS SuperSharpSilicon™ series video reaches 500 views mark

The NANOSENSORS screencast on SuperSharpSilicon™ AFM probes for high resolution imaging held by Dr. Oliver Krause just passed the 500 views mark. Congratulations Oliver! NANOSENSORS™… Read More »AFM probes for high resolution imaging – NANOSENSORS SuperSharpSilicon™ series video reaches 500 views mark