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scanning kelvin probe microscopy

Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy

Figure 1 from "Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy": Schematic of the experimental setup, NANOSENSORS PPP-NCST-Pt AFM probes were used

In their study “Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy” Kerstin Neuhaus, Giuliano… Read More »Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy

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Single pass Kelvin Force Microscopy

Sergei Magonov from NT-MDT captured this extremly impressing single pass Kelvin Force Micoscopy image of self-assemblies of semifluorinated alkanes (F12H12)

KPFM_01

Single-pass Kelvin Force Microscopy (KFM-PM) scan of self-assemblies of semifluorinated alkanes (F12H12) on HOPG. Height, capacitance gradients dC/dZ and dC/dV and surface potential. Images courtesy by Sergei Magonov, obtained with a NT-MDT Titanium scanning probe microscope and a NANOSENSORS PtSi-FM probe.

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