PointProbe® Plus (PPP)

Happy Swiss National Holiday with Smallest Swiss Cross

by NANOSENSORS
1 August 201715 March 2023
News & Events

20 bromine atoms positioned on a sodium chloride surface using the tip of an atomic force microscope at room temperature, creating a Swiss cross with the size of 5.6nm. The structure is stable at room temperature and was achieved by exchanging chlorine with bromine atoms. (Fig: University of Basel, Department of Physics), image made with NANOSENSORS PPP-NCL AFM tip

Basel University : Smallest Swiss Cross – Made of 20 Single Atoms ( a NANOSENSORS PPP-NCL was used for this image)

Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate

by NANOSENSORS
24 July 201715 March 2023
Science & Technology

Figure 2: AFM topography images of; (a) 130 nm BFO film grown on NGO and (b) on 100 nm LSCO layered NGO. (c,d) Section analysis along the lines drawn in (c) and (d), respectively, showing the puckering of the surfaces. from: Long-range Stripe Nanodomains in Epitaxial (110) BiFeO3 Thin Films on (100) NdGaO3 Substrate

NANOSENSORS PtIr coated PPP-EFM AFM tips were used for the PFM imaging in this interesting paper. Yogesh Sharma, Radhe Agarwal, Charudatta Phatak, Bumsoo Kim, Seokwoo… Read More »Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate

Hall effect in charged conducting ferroelectric domain walls

by NANOSENSORS
2 July 201715 March 2023
Science & Technology

from: Campbell M. P. et al., Hall effect in charged conducting ferroelectric domain walls, Figure 1: Piezoresponse and conductive analysis of domain structure in YbMnO3.

In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls. NANOSENSORS PPP-EFM AFM tips… Read More »Hall effect in charged conducting ferroelectric domain walls

Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

by NANOSENSORS
19 June 201715 March 2023
Science & Technology

Figure 1: OTFT structure and setup for force microscopy on bent substrates. From: T. Cramer et. al.Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark

by NANOSENSORS
28 April 201715 March 2023
Videos

The screencast held by Head of R&D Thomas Sulzbach on the NANOSENSORS PointProbe® Plus Silicon AFM probe series with a consistent tip shape leading to… Read More »Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark

Rapid mapping of polarization switching through complete information acquisition

by NANOSENSORS
22 February 201715 March 2023
Science & Technology

Rapid mapping of polarization switching through complete information acquisition

A NANOSENSORS PPP-EFM AFM tip was used in the research for this paper. Nature Comm: GMode makes piezoresponse force microscopy 1000 times faster. Suhas Somnath,,… Read More »Rapid mapping of polarization switching through complete information acquisition

Season’s Greetings

by NANOSENSORS
22 December 201615 March 2023
News & Events

NANOSENSORS PointProbe Plus AFM probe holiday edition

Seasonal Special Development: PointProbe Plus AFM tip with pine, snow and star coating. Happy Holidays to you all!