NANOSENSORS PPP-EFM AFM tips were used in the research for this article. Have a look at the abstract or follow the external link to the… Read More »Injection and controlled motion of conducting domain walls in improper ferroelectric Cu-Cl boracite
NANOSENSORS PtIr coated PPP-EFM AFM tips were used for the PFM imaging in this interesting paper. Yogesh Sharma, Radhe Agarwal, Charudatta Phatak, Bumsoo Kim, Seokwoo… Read More »Long-range Stripe Nanodomains in Epitaxial (110) BiFeO 3 Thin Films on (100) NdGaO 3 Substrate
In this article the authors demonstrate that intermittent-contact atomic force microscopy (AFM) can detect the Hall effect in conducting domain walls. NANOSENSORS PPP-EFM AFM tips… Read More »Hall effect in charged conducting ferroelectric domain walls
NANOSENSORS PPP-NCSTAu probes were used for scanning probe characterizations for this publication. Cramer, T. et al. Direct imaging of Defect Formation in Strained Organic Flexible… Read More »Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy
A NANOSENSORS PPP-EFM AFM tip was used in the research for this paper. Nature Comm: GMode makes piezoresponse force microscopy 1000 times faster. Suhas Somnath,,… Read More »Rapid mapping of polarization switching through complete information acquisition
Product Screencast on the NANOSENSORS™ Diamond Coated PointProbe® Plus Silicon AFM Probes by Jörg Diebel.
Read More »Product screencast NANOSENSORS™ Diamond Coated PointProbe Plus Silicon AFM Probes