This year NANOSENSORS™ celebrates its 30th anniversary. We are celebrating this with the whole #AFMcommunity by giving away NANOSENSORS™ Fun Gratings especially created for this occasion @BiophysicalSoc Meeting 2020 in San Diego at NanoAndMore USA booth no. 818 this week.
Pick up your grating, switch on the AFM, start scanning, discover the images that are hidden in the grating and celebrate 30 years of NANOSENSORS high quality AFM probes with us.
Controlling the work function of transition
metal oxides is of key importance with regard to future energy production and
storage. As the majority of applications involve the use of heterostructures,
the most suitable characterization technique is Kelvin probe force microscopy
(KPFM), which provides excellent energetic and lateral resolution.*
In their study “Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation» Dominik Wrana, Karol Cieślik, Wojciech Belza, Christian Rodenbücher, Krzysztof Szot and Franciszek Krok present the advantages and limitations of the FM-KPFM technique using the example of a newly discovered TiO/SrTiO3(100) (metal/insulator) heterostructure, which has potentially high technological relevance.*
In the same article a combined conductivity and work function study from the same surface area is presented, showing the possibility of obtaining full information on the electronic properties when the KPFM technique is accompanied by local conductivity atomic force microscopy (LC-AFM).*
The authos present the measurement of the crystalline TiO work function and its dependence on the gaseous pressure of air using Kelvin probe force microscopy.
Such cantilevers are widely used as conducting tips in a contact mode AFM, allowing for a high lateral resolution in conductivity measurements. The remarkable mechanical stability of the selected cantilevers allowed for the noncontact mode measurements (with a Kelvin loop) using the very same tip, maintaining oscillations at the higher harmonics of the fundamental frequency (≈75 kHz). Hence, in order to record current and CPD maps from the very same sample area, KPFM measurements were first performed with the soft cantilever forced to oscillate at higher harmonics, then the tip was retracted tens of nanometers from the surface, all feedback loops were turned down and a contact mode AFM scan was performed when approached with a single loop maintaining a deflection set point of 10–30 mV. The high conductivity of both TiO and STO materials enabled a low sample bias of +1 mV for the LC-AFM measurements to be used.*
Wrana, Karol Cieślik, Wojciech Belza, Christian Rodenbücher, Krzysztof Szot,
Franciszek Krok Kelvin probe force microscopy work function characterization of transition
metal oxide crystals under ongoing reduction and oxidation
Beilstein Journal of Nanotechnology 2019, 10, 1596–1607
The article “Kelvin probe force microscopy work function characterization of
transition metal oxide crystals under ongoing reduction and oxidation” by
Dominik Wrana, Karol Cieślik, Wojciech Belza, Christian Rodenbücher, Krzysztof
Szot and Franciszek Krok is licensed under a Creative Commons Attribution 4.0
International License, which permits use, sharing, adaptation, distribution and
reproduction in any medium or format, as long as you give appropriate credit to
the original author(s) and the source, provide a link to the Creative Commons
license, and indicate if changes were made. The images or other third party
material in this article are included in the article’s Creative Commons
license, unless indicated otherwise in a credit line to the material. If
material is not included in the article’s Creative Commons license and your
intended use is not permitted by statutory regulation or exceeds the permitted
use, you will need to obtain permission directly from the copyright holder. To
view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.