NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
The screencast held by Head of R&D Thomas Sulzbach on the NANOSENSORS PointProbe® Plus Silicon AFM probe series with a consistent tip shape leading to… Read More »Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark
The screencast on the soft, drift-reduced NANOSENSORS uniqprobe cantilevers for biology and life science applications held by Dr. Laure Aeschimann has just passed the 500… Read More »Soft, drift-reduced AFM cantilevers for Biology and Life Sciences – Uniqprobe Screencast passes the 500 views mark
NANOSENSORS is proudly sponsoring the Fourteenth International Workshop on Nanomechanical Sensors held at Kailua-Kona on the big island of Hawaii from 4-7 April 2017. You… Read More »NANOSENSORS proudly sponsors workshop on nanomechanical sensors
Prof. Ohmichi from Kobe University presented his first results on magnetometry using the NANOSENSORS Membrane-type Surface-stress Sensor (MSS) (NANOSENSORS special development code: SD-MSS-1K) at the… Read More »Magnetometry of microcrystals using a membrane piezoresistivesensor – NANOSENSORS MSS
Have a look at this useful blog article Why you shouldn’t just pick a cantilever that is lying around on Microscopy and Analysis explaining why… Read More »Why you shouldn’t just pick a cantilever that is “lying around”
ユニーク·プローブはバイオテクノロジー/ライフサイエンス分野のAFMに最適なプローブです。クォーツのような材料を用い主に低バネ定数のプローブをラインアップしています。カンチレバーの厚さ精度が良く、プローブ間の機械的特性のばらつきが小さいのが特長です。さらに反射膜をカンチレバー背面の一部のみに限定することで液中測定でのドリフトを大幅に低減しています。他に類を見ない良さがあるユニーク·プローブを是非お使いください。
A NANOSENSORS PPP-EFM AFM tip was used in the research for this paper. Nature Comm: GMode makes piezoresponse force microscopy 1000 times faster. Suhas Somnath,,… Read More »Rapid mapping of polarization switching through complete information acquisition