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NANOSENSORS

NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.

A Bis(terpyridine)nickel(II)-Based Coordination Nanosheet: A Redox-Active Materials with Flexibility and Transparency

Fig. 2f from Kenji Takada et al. 2024 “A Bis(terpyridine)nickel(II)-Based Coordination Nanosheet: A Redox-Active Material with Flexibility and Transparency” Synthesis and morphology identification of 1-Ni. f Topographic AFM image of 1-Ni on a flat Si substrate and the cross-sectional analysis inset For the full figure please refer to the cited article. NANOSENSORS PointProbe Plus® PPP-NCL AFM probes were used for the characterization with atomic force microscopy.

Since the discovery of graphene, extensive studies have revealed various types of novel two-dimensional polymers such as transition metal dichalcogenides, covalent organic frameworks, and carbon… Read More »A Bis(terpyridine)nickel(II)-Based Coordination Nanosheet: A Redox-Active Materials with Flexibility and Transparency