Don’t forget to visit us @NanoAndMore Japan booth 6A-402 in hall 6 at #JASIS2019 this week and let them explain with their fancy new #AFMtip models which #AFMprobe among the many options we offer is best for your #AtomicForceMicroscopy and #ScanningProbeMicroscopy application. We are looking forward to seeing you!
![](https://nanosensors.com/blog/wp-content/uploads/2022/11/NANOSENSORS-AFM-probes-at-NanoAndMore-Japan-booth-at-JASIS2019-have-a-look-at-AFM-tip-models-1024x858-2.jpg)