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Mechanical Property Measurements via Thermal Deflection Analysis in AFM

by NANOSENSORS
26 March 20269 July 2026
News & Events, Science & Technology

Figure 1: (a) Schematic diagrams of the cantilever models used in determining the dispersion curves to convert measured cantilever oscillation frequency to contact stiffness of the tip–sample contact. Three models are typically used

Accurate nanomechanical characterization is essential for advancing surface science and materials research. In this article, Thomas Mathias, Roland Bennewitz, and Philip Egberts demonstrate a method… Read More »Mechanical Property Measurements via Thermal Deflection Analysis in AFM