Tag Archives: contact mode

Substrate properties modulate cell membrane roughness by way of actin filaments

“Cell membrane roughness has been proposed as a sensitive feature to reflect cellular physiological conditions”*
In the article “Substrate properties modulate cell membrane roughness by way of actin filaments” Chao-Hung Chang, Hsiao-Hui Lee, and Chau-Hwang Lee employed the non-interferometric wide-field optical profilometry (NIWOP) technique to measure the membrane roughness of living mouse embryonic fibroblasts with different conditions of the culture substrate to find out whether membrane roughness is associated with the substrate properties. By controlling the surface density of fibronectin (FN) coated on the substrate, they found that cells exhibited higher membrane roughness as the FN density increased in company with larger focal adhesion (FA) sizes.

The examination of membrane roughness was also confirmed with atomic force microscopy.
The long cantilever of NANOSENSORS uniqprobe qp-SCONT AFM probes ( 125-μm long, spring constant 0.01 N/m.) was used to observe the membrane topography on living MEFs.

If you would like to learn more about the NANOSENSORS uniqprobe AFM probes series which offers soft, drift-reduced AFM probes with unsurpassed small variation in spring constant and resonance frequency mainly for biology and life science applications but also for other aplications such as high speed scanning then please have a look at our recently updated Uniqprobe brochure: https://www.nanosensors.com/pdf/NANOSENSORS-uniqprobe-brochure.pdf .

Supplementary Figure S1 from Chao-Hung Chang et al. “Substrate properties modulate cell membrane roughness by way of actin filaments”: Images of membrane topography determined by atomic force microscopy (AFM). MEFs were seeded on the polymer coverslip-bottom μ-dishes coated with 0 or 10 μg/ml FN for 6 hours for the measurement of membrane roughness by AFM. The regions marked by the white squares in the bright-field images are displayed in the membrane topography. Scale bar, 10 μm. NANOSENSORS uniqprobe qp-SCONT AFM probes(long cantilever length 125 um, spring constant 0.01 N/m) were used.
Supplementary Figure S1 from Chao-Hung Chang et al. “Substrate properties modulate cell membrane roughness by way of actin filaments”: Images of membrane topography determined by atomic force microscopy (AFM). MEFs were seeded on the polymer coverslip-bottom μ-dishes coated with 0 or 10 μg/ml FN for 6 hours for the measurement of membrane roughness by AFM. The regions marked by the white squares in the bright-field images are displayed in the membrane topography. Scale bar, 10 μm.

*Chao-Hung Chang, Hsiao-Hui Lee, Chau-Hwang Lee
Substrate properties modulate cell membrane roughness by way of actin filaments
Nature Scientific Reports, volume 7, Article number: 9068 (2017)
DOI: https://doi.org/10.1038/s41598-017-09618-y

Please follow this external link for the full article: https://rdcu.be/bdZm9

Open Access The article “Substrate properties modulate cell membrane roughness by way of actin filaments” by  Chao-Hung Chang et al. is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

Consistent AFM tip shape leading to reproducible results – NANOSENSORS PointProbe Plus Screencast passes 500 views mark

The screencast held by Head of R&D Thomas Sulzbach  on the  NANOSENSORS PointProbe® Plus Silicon AFM probe series  with a consistent tip shape leading to more reproducible results has just passed the 500 views mark.
Congratulations Thomas!

Screencasts on the PointProbe® Plus are also available in Japanese

and in Chinese:

also on youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html

视频介绍 – PointProbePlus原子力显微镜探针 – NANOSENSORS™ –

视频介绍 – PointProbePlus原子力显微镜探针 – NANOSENSORS™ –

在 Youtube:

和在  Youku

http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html?from=y1.7-1.2

NANOSENSORS的Pointprobes是第一个商业化量产的硅原子力显微镜探针。从1991年进入市场开始,他们就成为了这一领域的标杆。 PointProbePlus探针在非接触模式和轻敲模式的应用中取得了巨大的成功,并且在此基础上发展出一系列更高端的AFM探针。 PointprobePlus是Pointprobe的增强版,它有着更为一致的针尖形状从而保证了更为可靠的成像结果。 而且针尖的尖端性能进一步提升,其半锥角达到了10度,而尖端半径小于7nm。

基于PointProbePlus针尖,我们提供一些特别定制的AFM探针 。

SuperSharpSilicon探针是在PointProbePlus探针的基础上,通过尖端锐化技术,使其针尖的曲率半径小于2nm。
该探针在特征尺度为几十纳米的样品表面,可以实现最高的分辨率。

High Aspect Ratio tips 高长径比探针是在PointProbePlus的基础上,通过聚焦离子束研磨,在针尖的尖端1到两微米形成超小的锥角。
它们是专为半导体应用中,沟槽或通孔的表征而设计的。

硬磁或软磁性涂料可以把PointProbePlus转变为磁力显微镜探针。

金刚石涂层则可以极大地增加探针的耐磨损性,从而 使针尖样品间作用力很高的测量 成为可能。

另外,掺杂的金刚石针尖是导电的,这种探针也适用于导电测量模式,例如 扫描扩展电阻显微镜。