conductive atomic force microscopy

Insights into dynamic sliding contacts from conductive atomic force microscopy

by NANOSENSORS
12 August 202015 March 2023
Science & Technology

Figure 1 (a) from “Insights into dynamic sliding contacts from conductive atomic force microscopy” by Nicholas Chan et al: A schematic of the experimental setup is shown in Fig. 1(a). The experiment was conducted using an ultra-high vacuum (UHV)AFM at room temperature at a pressure of

Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating… Read More »Insights into dynamic sliding contacts from conductive atomic force microscopy