See you at AVS in Long Beach CA today
Meet our CEO this week at AVS 65th International Symposium and Exhibition in Long Beach CA.
Meet our CEO this week at AVS 65th International Symposium and Exhibition in Long Beach CA.
A NANOSENSORS AdvancedTEC ATEC-EFM PtIr coated AFM probe was used for the piezo force microscopy (PFM) characterization in this interesting paper by Borderon et.al Domain… Read More »Domain wall motion in Pb(Zr0.20Ti0.80)O3 epitaxial thin films
For this article the AFM images taken with tapping mode in Tris buffer solution were performed with the NANOSENSORS qp-BioAC (cantilever 3, resonance frequency 30kHz).… Read More »Zn2+-triggered self-assembly of Gonadorelin [6-D-Phe] to produce nanostructures and fibrils
NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM) for scanning and studying sample surfaces with magnetic features: PPP-MFMR PPP-LM-MFMR… Read More »AFM probes for Magnetic Force Microscopy Screencast passed 1000 views mark
It is the last day if the International Scanning Probe Microscopy (ISPM) 2018 conference in Tempe, Arizona. Don’t forget to pass by the NanoAndMore USA… Read More »Learn more about our new AFM probes at ISPM 2018
Dr. Oliver Krause’s screencast on the history of NANOSENSORS AFM probes has just passed the 1000 views mark. Congratulations Oliver! This screencast is is also… Read More »History of NANOSENSORS AFM Probes Video has passed 1000 Views Mark