Blog – NANOSENSORS™ – R&D Leaders in AFM Probes Since 1990 – Page 22 – Check out our blog for the latest news and developments in nano technology.

Happy New Lunar Year

by NANOSENSORS
4 February 201915 March 2023
News & Events

NANOSENSORS AFM probes wishes everyone a good start into the new lunar year of the pig

The year of the pig has started. Happy New Lunar Year!

Nanotechnology conference in Japan – Welcome at nano tech 2019

by NANOSENSORS
30 January 201915 March 2023
News & Events

visit our distributor for NANOSENSORS AFM probes in Japan Toyo Technica at nano tech 2019

Learn more about NANOSENSORS AFM probes at booth 4T-13 of our distributor in Japan, TOYO Corporation at this week’s nano tech 2019 . Exhibition dates:… Read More »Nanotechnology conference in Japan – Welcome at nano tech 2019

5′-(CGA)n sequence-assisted pH-controlled assembly of supramolecular DNA nanostructure

by NANOSENSORS
18 January 201915 March 2023
Science & Technology

Figure 5. from “5′-(CGA)n sequence-assisted pH-controlled assembly of supramolecular DNA nanostructure” by Yuting Yan et al.: AFM images of the nanostructures formed by DNA G-quadruplexes self-assembly in KOAc buffer solution; (a,b) SG2 at pH 9.0, (c,d) SG2 at pH 4.5, (e,f) a mixture of SG2 and CSG2 at pH 4.5, (g,h) a mixture of SG2 and CSG2 at pH 9.0. The length of side is 2 µm and the scale bar is 500 nm. NANOSENSORS™ PointProbe® Plus PPP-NCHR AFM probes were used for all AFM images.

In the research article “5′-(CGA)n sequence-assisted pH-controlled assembly of supramolecular DNA nanostructure” Yuting Yan, Yanwei Cao, Chunsheng Xiao, Yang Li, Xiaoxuan Xiang and Xinhua Guo… Read More »5′-(CGA)n sequence-assisted pH-controlled assembly of supramolecular DNA nanostructure

Substrate properties modulate cell membrane roughness by way of actin filaments

by NANOSENSORS
4 January 201915 March 2023
Science & Technology

Supplementary Figure S1 from Chao-Hung Chang et al. “Substrate properties modulate cell membrane roughness by way of actin filaments”: Images of membrane topography determined by atomic force microscopy (AFM). MEFs were seeded on the polymer coverslip-bottom μ-dishes coated with 0 or 10 μg/ml FN for 6 hours for the measurement of membrane roughness by AFM. The regions marked by the white squares in the bright-field images are displayed in the membrane topography. Scale bar, 10 μm. NANOSENSORS uniqprobe qp-SCONT AFM probes(long cantilever length 125 um, spring constant 0.01 N/m) were used.

“Cell membrane roughness has been proposed as a sensitive feature to reflect cellular physiological conditions”* In the article “Substrate properties modulate cell membrane roughness by… Read More »Substrate properties modulate cell membrane roughness by way of actin filaments

Season’s Greetings from NANOSENSORS AFM probes

by NANOSENSORS
20 December 201815 March 2023
News & Events

With this Seasonal Special Development PointProbe Plus AFM tip with pine, snow and star coating we would like to wish all users of our AFM… Read More »Season’s Greetings from NANOSENSORS AFM probes

Optical control of polarization in ferroelectric heterostructures

by NANOSENSORS
17 December 201815 March 2023
Science & Technology

Figure 1 from “Optical control of polarization in ferroelectric heterostructures”: Electrically induced polarization switching in the MoS2/BaTiO3/SrRuO3 junction. a, b PFM phase (a) and amplitude (b) images after application of a negative voltage pulse (−5 V, 0.5 s) to the MoS2 flake. The 12-u.c.-thick BTO film underneath the MoS2 flake is fully switched to the upward polarization, Pup. c, d PFM phase (c) and amplitude (d) images after application of several positive voltage pulses (+5 V, 0.5 s) to the MoS2 flake. BTO underneath the MoS2 flake is fully switched to downward polarization, Pdown. The polarization state of the bare BTO film (at the lower right corner) is not affected by the electrical bias. e, f The I–V characteristics of the same junction measured in the dark and during illumination. The tunneling current for the OFF state (Pup) is largely increased under illumination. Silicon AFM probes with Pt/Ir conductive coating and nominal stiffness of 3 N m−1 (PPP-EFM, NANOSENSORS) were used to perform the KPFM and PFM measurements.

“In the ferroelectric devices, polarization control is usually accomplished by application of an electric field.”* In the article “Optical control of polarization in ferroelectric heterostructures”… Read More »Optical control of polarization in ferroelectric heterostructures

Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy

by NANOSENSORS
4 December 201815 March 2023
Science & Technology

Figure 1 from "Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy": Schematic of the experimental setup, NANOSENSORS PPP-NCST-Pt AFM probes were used

In their study “Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy” Kerstin Neuhaus, Giuliano… Read More »Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy