NANOSENSORS PointProbePlusプローブ
走査型プローブ顕微鏡(SPM)および原子間力顕微鏡(AFM)に使われるプローブ/カンチ レバーには選択に困るほど数多くの種類があります。だからこそ、まずはこれをお使 いくださいとお勧めするのは「シリコン標準プローブ PointProbe®Plus」。「標準」 に求められる高品質と高精度を備え幅広いアプリケーションにご利用頂けます。 https://youtu.be/4eiL8lpQ3fE
NANOSENSORS
NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
See you at the Arablab in Dubai next week
See you at the Sigma Enterprises booth at the Arablab in Dubai March 20 – 23, 2016, hall S-3, stall no. 905 #ARABLAB
Happy Birthday Atomic Force Microscope!
30 years ago, on March 3rd 1986, Gerd Binnig, Carl Quate and Christoph Gerber published a paper simply titled Atomic Force Microscope. Happy Birthday! Reprinted… Read More »Happy Birthday Atomic Force Microscope!
High quality AFM tips for the use in ScanAsyst® mode: NANOSENSORS™ uniqprobe® BioT
In this application image we used the small cantilever of the NANOSENSORS™ uniqprobe® BioT to scan in ScanAsyst® mode in air. We imaged crystallites with… Read More »High quality AFM tips for the use in ScanAsyst® mode: NANOSENSORS™ uniqprobe® BioT
NANOSENSORS 磁力显微镜探针 MFM
The screencast on NANOSENSORS AFM probes for Magnetic Force Microscopy (MFM) is now available in Chinese on youtube and youku NANOSENSORS 磁力显微镜探针 MFM 在 Youtube… Read More »NANOSENSORS 磁力显微镜探针 MFM
NANOSENSORS at MRS Fall 2016
Have you seen the NANOSENSORS corner at the NanoAndMore booth 610 at MRS Fall 2016 already? Don’t forget to visit.