NANOSENSORS heads the world market with its innovative high quality scanning probes for SPM (Scanning Probe Microscopy) and AFM (Atomic Force Microscopy). NANOSENSORS' AFM probes, AFM tips and Cantilevers contribute to many scientific breakthroughs in Nanotechnology.
NANOSENSORS PPP-NCHAu and PPP-FMAu AFM tips were used in the research for this interesting paper Derek Novak et al. Nanoscale chemical imaging by photoinduced force… Read More »Nanoscale chemical imaging by photoinduced force microscopy
Have you already seen the NANOSENSORS AFM tips display at the Toyo booth 6A-404 at JASIS 2016? Don’t forget to visit us. Dr. Terunobu Akiyama… Read More »Visit us at JASIS 2016
A thin and very flexible polymer lamella with a high aspect ratio should be characterized by Atomic Force Microscopy. When imaged in Tapping Mode, we… Read More »Low Interaction Force Imaging with NANOSENSORS™ Heartbeat Cantilevers
We will be demonstrating our MSS Sensors at the NanoAndMore booth at the NMC 2016 from June 22-24, 2016 in Delft. You’re welcome to pass… Read More »Learn more about our MSS Sensors at NMC 2016
Gerd Binning, Christoph Gerber and Calvin Quate have been awarded the 2016 Kavli Prize in Nanoscience for the invention of the Atomic Force Microscope (AFM).… Read More »2016 Kavli Prize in Nanoscience Awarded to Gerd Binnig, Christoph Gerber, Calvin Quate for Invention of AFM
This collection of articles by Physical review letters marks the 35th anniversary of scanning tunneling microscopy and the 30th anniversary of atomic force microscopy http://journals.aps.org/prl/scanning-probe-microscopy… Read More »35th anniversary of scanning tunneling microscopy, 30th anniversary of atomic force microscopy and … 25 years NANOSENSORS AFM probes
