Tag Archives: PPP-QLC-MFMR

NANOSENSORS AFM probes for Magnetic Force Microscopy

Did you know that NANOSENSORS offers six different types of AFM probes for Magnetic Force Microscopy ( MFM) for scanning and investigating sample surfaces with magnetic features?

PPP-MFMR – AFM tip with hard magnetic coating, sensitivity, resolution and coercivity designed for standard magnetic force microscopy applications

PPP-LM-MFMR – designed for magnetic force microscopy with reduced disturbance of the magnetic sample by the MFM tip and enhanced lateral resolution

PPP-LC-MFMR –  MFM tip with soft magnetic coating designed for the measurement of magnetic domains in soft magnetic samples

PPP-QLC-MFMR –  low coercivity MFM probe designed for high operation stability and low disturbance of magnetic samples under ultrahigh vacuum ( UHV ) conditions

SSS-MFMR – SuperSharp MFM probe for high resolution magnetic force imaging, low magnetic moment for reduced disturbance of soft magnetic samples

SSS-QMFMR – SuperSharp MFM probe for high resolution magnetic force imaging with a high mechanical Q-factor for applications in ultrahigh vacuum ( UHV ) .

The screencast introducing all these different MFM probes, their properties and their applications held by our Head of R&D Thomas Sulzbach has just passed the 1500 views mark. Congratulations Thomas!

NANOSENSORS AFM tips for Magnetic Force Microscopy

For further details please have a look at the NANOSENSORS MFM probes brochure.

Application examples for NANOSENSORS AFM probes for Magnetic Force Microscopy can be found in the NANOSENSORS blog.

NANOSENSORS screencasts on Magnetic Force Microscopy AFM probes are also available in

Chinese

on youku http://v.youku.com/v_show/id_XNzMyMDg2MjQ4.html

and Youtube

and

Japanese