Electrostatic Force Microscopy/ Electrical Measurement (EFM)
PointProbe® Plus Platinum-Iridium coated
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Platinum Silicide AFM Probes
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Conductive Diamond coated
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CDT-FMR
- Force Modulation Mode
- C = 6.2 N/m; fo = 105 kHz
- Backside Reflex coating
- Conductive Diamond coated Tip
CDT-NCHR
- Non-Contact High frequency
- C = 80 N/m; fo = 400 kHz
- Backside Reflex coating
- Conductive Diamond coated Tip
CDT-NCLR
- Non-Contact Long cantilever
- C = 72 N/m; fo = 210 kHz
- Backside Reflex coating
- Conductive Diamond coated Tip
AdvancedTEC™
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ATEC-CONTPt
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Contact Mode
- C = 0.2 N/m; fo = 15 kHz
- PtIr5 coated probe
ATEC-CONTAu
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Contact Mode
- C = 0.2 N/m; fo = 15 kHz
- Au coating (both sides)
ATEC-NCPt
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Non-Contact
- C = 45 N/m; fo = 335 kHz
- PtIr5 coated probe
ATEC-NCAu
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Non-Contact
- C = 45 N/m; fo = 335 kHz
- Au coating (both sides)
ATEC-FMAu
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Force Modulation Mode
- C = 2.8 N/m; fo = 85 kHz
- Au coating (both sides)
ATEC-EFM
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- C = 2.8 N/m; fo = 85 kHz
- PtIr5 coated probe
PointProbe® Plus Gold coated
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