- Contact Mode
- PtIr5 coated probe
- C = 0.2 N/m; fo = 13 kHz
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Electrostatic Force Microscopy / Electrical Measurement AFM Probes
Most popular in this category
PointProbe® Plus Platinum-Iridium coated
Platinum Silicide AFM Probes
Conductive Diamond coated
CDT-CONTR
- Contact Mode
- Conductive Diamond coated Tip
- Backside Reflex coating
- C = 0.5 N/m; fo = 20 kHz
CDT-FMR
- Force Modulation Mode
- Conductive Diamond coated Tip
- Backside Reflex coating
- C = 6.2 N/m; fo = 105 kHz
CDT-NCHR
- Non-Contact High frequency
- Conductive Diamond coated Tip
- Backside Reflex coating
- C = 80 N/m; fo = 400 kHz
CDT-NCLR
- Non-Contact Long cantilever
- Conductive Diamond coated Tip
- Backside Reflex coating
- C = 72 N/m; fo = 210 kHz
AdvancedTEC™
ATEC-CONTPt
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Contact Mode
- PtIr5 coated probe
- C = 0.2 N/m; fo = 15 kHz
ATEC-CONTAu
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Contact Mode
- Au coating (both sides)
- C = 0.2 N/m; fo = 15 kHz
ATEC-NCPt
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Non-Contact
- PtIr5 coated probe
- C = 45 N/m; fo = 335 kHz
ATEC-NCAu
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Non-Contact
- Au coating (both sides)
- C = 45 N/m; fo = 335 kHz
ATEC-FMAu
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- Force Modulation Mode
- Au coating (both sides)
- C = 2.8 N/m; fo = 85 kHz
ATEC-EFM
- Advanced Tip at the End of the
Cantilever™ - real tip visibility from top
- PtIr5 coated probe
- C = 2.8 N/m; fo = 85 kHz
PointProbe® Plus Gold coated
