Enhanced Resolution Imaging

Most Popular Probe in this category

 Super sharp silicon afm tip 2
SSS-NCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating

SuperSharpSilicon™

Click on Order code for spec sheet.
SSS-NCH
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
SSS-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
SSS-SEIH
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
SSS-NCHR
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
  • Backside Reflex coating
SSS-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating
SSS-SEIHR
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
  • Backside Reflex coating
SSS-FM
  • Force Modulation Mode
  • C = 2.8 N/m; fo = 75 kHz
SSS-FMR
  • Force Modulation Mode
  • C = 2.8 N/m; fo = 75 kHz
  • Backside Reflex coating
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