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Enhanced Resolution Imaging AFM Probes

Enhanced Resolution Imaging AFM Probes

Enhanced Resolution Imaging AFM Probes

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SSS-NCHR
SSS-NCHR
  • Non-Contact High frequency
  • Back side Reflex coating
  • C = 42 N/m; fo = 330 kHz

SuperSharpSilicon™

SuperSharpSilicon™
SSS-NCH
  • Non-Contact High frequency
  • C = 42 N/m; fo = 330 kHz
SSS-NCL
  • Non-Contact Long AFM cantilever
  • C = 48 N/m; fo = 190 kHz
SSS-SEIH
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
SSS-NCHR
  • Non-Contact High frequency
  • Back side Reflex coating
  • C = 42 N/m; fo = 330 kHz
SSS-NCLR
  • Non-Contact Long AFM cantilever
  • Back side Reflex coating
  • C = 48 N/m; fo = 190 kHz
SSS-SEIHR
  • for Seiko Instruments microscope
  • Back side Reflex coating
  • C = 15 N/m; fo = 130 kHz
SSS-FM
  • Force Modulation Mode
  • C = 2.8 N/m; fo = 75 kHz
SSS-FMR
  • Force Modulation Mode
  • Back side Reflex coating
  • C = 2.8 N/m; fo = 75 kHz