Enhanced Resolution Imaging

XY-Alignment Compatible SuperSharpSilicon™ Types

Click on Order code for spec sheet.

SSS-NCL

Non-Contact Long cantilever
C = 48 N/m; fo = 190 kHz

SSS-SEIH

for Seiko Instruments microscope
C = 15 N/m; fo = 130 kHz

SSS-NCLR

Non-Contact Long cantilever
C = 48 N/m; fo = 190 kHz
Backside Reflex coating

SSS-SEIHR

for Seiko Instruments microscope
C = 15 N/m; fo = 130 kHz
Backside Reflex coating

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