Enhanced Resolution Imaging

XY-Alignment Compatible SuperSharpSilicon™ Types

Click on Order code for spec sheet.
SSS-NCL
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
SSS-SEIH
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
SSS-NCLR
  • Non-Contact Long cantilever
  • C = 48 N/m; fo = 190 kHz
  • Backside Reflex coating
SSS-SEIHR
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
  • Backside Reflex coating
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