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Enhanced Resolution Imaging

Enhanced Resolution Imaging

Enhanced Resolution Imaging

Most popular in this category

SSS-NCLR
SSS-NCLR
  • Non-Contact Long AFM cantilever
  • Back side Reflex coating
  • C = 48 N/m; fo = 190 kHz

XY-Alignment Compatible SuperSharpSilicon™ Types

XY-Alignment Compatible SuperSharpSilicon™ Types
SSS-NCL
  • Non-Contact Long AFM cantilever
  • C = 48 N/m; fo = 190 kHz
SSS-SEIH
  • for Seiko Instruments microscope
  • C = 15 N/m; fo = 130 kHz
SSS-NCLR
  • Non-Contact Long AFM cantilever
  • Back side Reflex coating
  • C = 48 N/m; fo = 190 kHz
SSS-SEIHR
  • for Seiko Instruments microscope
  • Back side Reflex coating
  • C = 15 N/m; fo = 130 kHz