PL2-NCHR

PLateau Tip - Non-Contact / Tapping Mode - High Resonance Frequency - Reflex Coating

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:

  • plateau diameter of typically 1.8 µm
  • single crystalline silicon
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • high mechanical Q-factor for high sensitivity
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 330 204 - 497
Force Constant /(N/m) 42 10 - 130
Length /µm 125 115 - 135
Mean Width /µm 30 22.5 - 37.5
Thickness /µm 4 3 - 5
Technical Data Tip Value
Plateau diameter (*) /µm 1.8 ± 0.5
Plateau rod height /µm 2.0
Plateau edge radius /µm 0.2 - 0.4
Tip height (overall) /µm 10 - 15
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PL2-NCHR-10 10 of all probes