PL2-CONTR

PLateau Tip - Contact Mode - Reflex Coating

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:

  • plateau diameter of typically 1.8 µm
  • single crystalline silicon
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency / kHz 13 6 - 21
Force Constant /(N/m) 0.2 0.02 - 0.77
Length /µm 450 440 - 460
Mean Width /µm 50 42.5 - 57.5
Thickness /µm 2 1 - 3
Technical Data Tip Value
Plateau diameter (*) /µm 1.8 ± 0.5
Plateau rod height /µm 2.0
Plateau edge radius /µm 0.2 - 0.4
Tip height (overall) /µm 10 - 15
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PL2-CONTR-10 10 of all probes