How To Buy

PL2-NCL

PLateau Tip -Non-Contact /Tapping Mode - Long Cantilever

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-NCL AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PL2-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 7 6.0 - 8.0
Mean Width /µm 38 30 - 45
Length /µm 225 215 - 235
Force Constant /(N/m) 48 21 - 98
Resonance Frequency /kHz 190 146 - 236
Technical Data Tip Value
Plateau diameter (*) /µm 1.8 ± 0.5
Plateau rod height /µm > 2
Plateau edge radius /µm 0.2 - 0.4
Tip height (overall) /µm 10 - 15

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PL2-NCL-10 10 of all probes none



For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com


NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG