The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PL2-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.
|Property||Nominal Value||Specified Range|
|Thickness /µm||7||6.0 - 8.0|
|Mean Width /µm||38||30 - 45|
|Length /µm||225||215 - 235|
|Force Constant /(N/m)||48||21 - 98|
|Resonance Frequency /kHz||190||146 - 236|
|Technical Data Tip||Value|
|Plateau diameter (*) /µm||1.8 ± 0.5|
|Plateau rod height /µm||> 2|
|Plateau edge radius /µm||0.2 - 0.4|
|Tip height (overall) /µm||10 - 15|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PL2-NCLR-10||10||of all probes||reflex|