The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request
|Property||Nominal Value||Specified Range|
|Thickness /µm||2||1.0 - 3.0|
|Mean Width /µm||50||42 - 57|
|Length /µm||450||440 - 460|
|Force Constant /(N/m)||0.2||0.02 - 0.77|
|Resonance Frequency /kHz||13||6 - 21|
|Technical Data Tip||Value|
|Plateau diameter (*) /µm||1.8 ± 0.5|
|Plateau rod height /µm||> 2.0|
|Plateau edge radius /µm||0.2 - 0.4|
|Tip height (overall) /µm||10 - 15|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PL2-CONT-10||10||of all probes||none|