PL2-CONT
PLateau Tip - Contact Mode
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request
- The probe offers unique features:
- - plateau diameter of typically 1.8 µm
- single crystalline silicon
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
| Technical Data | Nominal Value | Specified Range |
|---|---|---|
| Thickness /µm | 2 | 1.0 - 3.0 |
| Mean Width /µm | 50 | 42.5 - 57.5 |
| Length /µm | 450 | 440 - 460 |
| Force Constant /(N/m) | 0.2 | 0.02 - 0.77 |
| Resonance Frequency /kHz | 13 | 6 - 21 |
| Technical Data Tip | Value |
|---|---|
| Plateau diameter (*) /µm | 1.8±0.5 |
| Plateau rod height /µm | >2.0 |
| Plateau edge radius /µm | 0.2-0.4 |
| Tip height (overall) /µm | 10-15 |
* measured at a distance of 100nm from the end-face
| Order Code | Quantity | Data Sheet | Coating |
|---|---|---|---|
| PL2-CONT-10 | 10 | of all probes | none |
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