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SuperSharpSilicon™ - Non-Contact / Tapping Mode - High Resonance Frequency

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Resonance Frequency /kHz 330 204 - 497
Force Constant /(N/m) 42 10 - 130
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 30 - 45
Length /µm 125 115 - 135

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
SSS-NCH-10 10 of all probes none
SSS-NCH-20 20 of all probes none
SSS-NCH-50 50 without none
SSS-NCH-W >370 of up to 32 probes none

Product screencast NANOSENSORS SuperSharpSilicon

Product Screencast on the NANOSENSORS™ SuperSharpSilicon™ High Resolution AFM Probes held by product developer Dr. Oliver Krause.
Please subscribe to the NANOSENSORS Youtube Channel.

For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / /

NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG
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