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PointProbe® Plus SEIKO microscopes - Non-Contact /Tapping Mode High Force Constant

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).

The probe offers unique features:

Cantilever data:

Property Nominal Value Specified Range
Resonance Frequency /kHz 130 96 - 175
Force Constant /(N/m) 15 5 - 37
Thickness /µm 5 4.0 - 6.0
Mean Width /µm 33 25 - 40
Length /µm 225 215 - 235

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PPP-SEIH-10 10 of all probes none
PPP-SEIH-20 20 of all probes none
PPP-SEIH-50 50 without none
PPP-SEIH-W > 380 of up to 32 probes none

Product screencast NANOSENSORS™ PointProbe® Plus AFM Probes

Please watch the new product screencast on NANOSENSORS™ PointProbe® Plus AFM Probes at
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For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / /

NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG
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