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PPP-SEIH
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PPP-SEIH

Cantilever data:
Property Nominal Value Specified Range
Resonance Frequency [kHz] 130 96 - 175
Force Constant [N/m] 15 5 - 37
Length [µm] 225 215 - 235
Mean Width [µm] 33 25 - 40
Thickness [µm] 5 4 - 6
Order codes and shipping units:
Order Code AFM probes per pack Data sheet
PPP-SEIH-10 10 of all probes
PPP-SEIH-20 20 of all probes
PPP-SEIH-50 50
PPP-SEIH-W 380 of up to 32 probes
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip front view
PointProbe® Plus AFM tip closeup
PointProbe® Plus AFM tip closeup
NANOSENSORS™ PointProbe® Plus AFM Probes

PointProbe® Plus SEIKO microscopes - Non-Contact /Tapping Mode High Force Constant

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).

The AFM probe offers unique features:

  • guaranteed AFM tip radius of curvature < 10 nm
  • AFM tip height 10 - 15 µm
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.

How to optimize AFM scanning parameters: list-img