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| Property | Nominal Value | Specified Range |
|---|---|---|
| Resonance Frequency [kHz] | 20 | 11 - 29 |
| Force Constant [N/m] | 0.5 | 0.1 - 1.7 |
| Length [µm] | 450 | 440 - 460 |
| Mean Width [µm] | 50 | 42.5 - 57.5 |
| Thickness [µm] | 2 | 1 - 3 |
| Order Code | AFM probes per pack | Data sheet |
|---|---|---|
| CDT-CONTR-10 | 10 | of all probes |
| CDT-CONTR-20 | 20 | of all probes |
| CDT-CONTR-50 | 50 |
NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic AFM tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.
