PointProbe® Plus Non-Contact / Tapping Mode - High Resonance Frequency - PtIr5 Coating
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible AFM tip radius as well as a more defined AFM tip shape. The minimized variation in AFM tip shape provides more reproducible images.
NANOSENSORS™ PPP-NCHPt AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.
The AFM probe offers unique features:
- metallic conductivity of the AFM tip
- radius of curvature better than 25 nm
- AFM tip height 10 - 15 µm
- high mechanical Q-factor for high sensitivity
The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.
Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.
This AFM probe features alignment grooves on the back side of the holder chip. These grooves fit to the NANOSENSORS Alignment Chip.