| |
Type |
Application |
Force constant /
[N/m]
(typical) |
Resonance frequency /
[kHz]
(typical) |
Coatings |
Special tip versions |
| Contact |
ATEC-CONT |
Contact Mode |
0.2 |
15 |
— |
— |
| PPP-CONT |
Contact Mode |
0.2 |
13 |
Reflex, PtIr5, Au, AuD
(optional) |
DT, CDT, RT |
| PPP-CONTSC |
Contact Mode (short cantilever) new |
0.2 |
25 |
Reflex, PtIr5, Au, AuD
(optional) |
— |
| PPP-XYCONTR |
Contact Mode
(XY-autoalignment
with Alignment Chip) new |
0.2 |
13 |
Reflex |
— |
TL-CONT |
Contact Mode
(tipless cantilever) |
0.2 |
13 |
— |
— |
| PL2-CONT |
Contact Mode (plateau tip) new |
0.2 |
13 |
Reflex
(optional) |
Plateau |
| PPP-ZEILR |
Contact Mode, Seiko or
Zeiss Contact Mode |
1.6 |
27 |
Reflex |
— |
| Non Contact |
ATEC-NC |
Non-Contact / Tapping Mode |
45 |
335 |
— |
— |
| PPP-NCH |
Non-Contact / Tapping Mode
(high frequency) |
42 |
330 |
Reflex, PtIr5, Au, AuD
(optional) |
SSS, RT, AR5, AR5T, AR10T, AR10, DT, CDT |
| PPP-XYNCHR |
Non-Contact / Tapping Mode
(high frequency)
(XY-autoalignment
with Alignment Chip) new |
42 |
330 |
Reflex |
— |
| PPP-QNCHR |
Non-Contact / Tapping Mode
(high frequency, high quality factor) |
42 |
330 |
Reflex |
— |
| TL-NCH |
Non-Contact/Tapping Mode
(tipless cantilever) |
42 |
330 |
— |
— |
| PL2-NCH |
Non-Contact/
Tapping Mode
High frequency new |
42 |
330 |
Reflex
(optional) |
Plateau |
|
PPP-NCL |
Non-Contact / Tapping Mode
(long cantilever) |
48 |
190 |
Reflex,
PtIr5, Au, AuD
(optional) |
SSS,
AR5,
DT,
CDT |
|
TL-NCL |
Non-Contact / Tapping Mode
(long cantilever, tipless cantilever) |
48 |
190 |
— |
— |
PL2-NCL |
Non-Contact/
Tapping Mode
(Long Cantilever) new |
48 |
190 |
Reflex
(optional) |
Plateau |
PPP-NCST |
Non-Contact Soft Tapping new |
7.4 |
160 |
Reflex,
PtIr,
Au,
AuD
(optional) |
— |
|
PPP-SEIH |
Non-Contact / Tapping Mode,
Seiko Non-Contact Mode |
15 |
130 |
Reflex
(optional) |
SSS |
| Special |
ATEC-FM |
Force Modulation Mode |
2.8 |
85 |
— |
— |
|
PPP-LFMR |
Lateral / Friction Force Microscopy |
0.2 |
25 |
Reflex
|
— |
| PPP-FM |
Force Modulation Mode |
2.8 |
75 |
Reflex, Au, AuD,
(optional) |
DT, CDT, RT |
| PPP-QFM |
Force Modulation Mode
(high quality factor) |
2.8 |
75 |
Reflex |
— |
|
TL-FM |
Force Modulation Mode
(tipless cantilever) |
2.8 |
75 |
— |
— |
PL2-FM |
Force Modulation Mode new |
2.8 |
75 |
Reflex
(optional) |
Plateau |
|
PPP-EFM |
Electrostatic Force Microscopy |
2.8 |
75 |
PtIr5, Au |
— |
| PPP-MFMR |
Magnetic Force Microscopy |
2.8 |
75 |
Hard Magnetic and Reflex |
— |
| PPP-LM-MFMR |
Low Moment
Magnetic Force Microscopy |
2.8 |
75 |
Hard Magnetic and Reflex |
— |
| PPP-LC-MFMR |
Low Coercivity
Magnetic Force Microscopy |
2.8 |
75 |
Soft Magnetic and Reflex |
— |
| PPP-QLC-MFMR |
High Quality-Factor
Low Coercivity
Magnetic Force Microscopy |
2.8 |
75 |
Soft Magnetic and Reflex |
— |
| SSS-MFMR |
SuperSharp Silicon
Magnetic Force Microscopy |
2.8 |
75 |
Hard Magnetic and Reflex |
— |
| SSS-QMFMR |
SuperSharp Silicon
High Quality Factor
Magnetic Force Microscopy |
2.8 |
75 |
Hard Magnetic and Reflex |
— |
