AFM Probes, Atomic Force Microscope Tips NANOSENSORS AFM Probes
Products Catalogue for AFM Tips
Selected by Measuring Mode or Application

Non-Contact / Tapping Mode (NC)
Non-Contact / Tapping Mode (NC)		 Force Modulation Mode (FM)
Force Modulation Mode (FM)		 Contact Mode (Cont)
Contact Mode (Cont)
Electrostatic Force Modulation (EFM) / Electrical Measurement
Electrostatic Force Modulation (EFM) /
Electrical Measurement		 Force Modulation Mode (FM)
Magnetic Force Microscopy
(MFM)		 Lateral Force Microscopy (LFM)
Lateral Force Microscopy
(LFM)
Enhanced Resolution Imaging
Enhanced Resolution
Imaging		 Trench Measurement
Trench Measurement		 Nanoindentation
Nanoindentation
Biological Applications / Soft Contact Measurement
Biological Applications /
Soft Contact Measurement		 Self-sensing + self-actuating
Self-sensing + self-actuating		 Tipless Cantilever for Probe Modification
Tipless Cantilever
for Probe Modification
Special Developments
Special Developments		 Metrology Standards
Transfer Standards		 Accessories
Alignment Chip & Accessories