Products Line-Up

Self-sensing and Self-actuating Probe
Tip Order-code Probes per set Short description
A-PROBE Novel self-sensing, self-actuating AFM probe for intermittent contact
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Non-Contact / Tapping-Mode Sensors
Tip Order-code Probes per set Short description
uniqprobe™ uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode,
with 3 different cantilevers, backside partial Au coating

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode,
with 2 different triangular cantilevers, backside partial Au coating

Platinum Silicide SPM-Probe with conductive silicide coating for non-contact- / tapping-mode
Advanced TEC™ AdvancedTEC™ Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode
AdvancedTEC™ Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode Pt/Ir coating
AdvancedTEC™ Silicon-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, detector and tip side: Au coating
POINTPROBE PLUS® POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- / tapping-mode detector side: Al-coating
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode
detector side: Al-coating, Autoalignment Chip
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, High quality factor
detector side: Al-coating
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector side: Al-coating
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector side: Al-coating, XY-auto alignment
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, detector side: Au-coating
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- / tapping-mode, detector and tip side: Au-coating
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector side: Au-coating
POINTPROBE®-PLUS Silicon-SPM-Probe, silicon cantilever for non-contact- /tapping-mode, soft tapping, detector and tip side: Au-coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,silicon cantilever for non-contact- /tapping-mode, tip rotated by 180°,
detector side: Al-coating
SUPERSHARP SILICON SUPERSHARPSILICON™-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, with SUPERSHARPSILICON tip
detector side: Al-coating
SUPERSHARPSILICON™-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, with SUPERSHARPSILICON tip
HIGH ASPECT RATIO HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1
HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1,
detector side: Al-coating
TILT COMPENSATED HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1, tilt compensation 13°
TILT COMPENSATED HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1, tilt compensation 13°, detector side: Al-coating
HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- / tapping-mode
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1
HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- / tapping-mode
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1, detector side: Al-coating
TILT COMPENSATED HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1, tilt compensation 13°
TILT COMPENSATED HIGH ASPECT RATIO Sensor, silicon cantilever for non-contact- /tapping-mode,
HIGH ASPECT RATIO tip, aspect ratio ≥ 10:1, tilt compensation 13°, detector side: Al-coating
PLATEAU Tips Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact- / tapping-mode,
detector side: Al-coating
Silicon-SPM-Probe with plateau tip, silicon cantilever for non-contact- / tapping-mode,
detector side: Al-coating
Diamond Coated DIAMOND COATED Sensor, silicon cantilever for non-contact- /tapping-mode,
detector side: Al-coating,
tip side: Diamond-coating
1Including datasheet of all probes.
2Including datasheet of up to 32 probes.
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Non-Contact / Tapping-Mode Sensors - long cantilever -
Tip Order-code Probes per set Short description
POINTPROBE PLUS® POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, long cantilever
POINTPROBE-PLUS® Silicon-SPM-Sensor, silicon cantilever for non-contact- /tapping-mode, long cantilever,
detector side: Al-coating
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for non-contact- / tapping-mode,
long cantilever
,
detector side: Au-coating,/p
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for non-contact- /tapping-mode, long cantilever,
detector and tip side: Au-coating
SUPERSHARP SILICON SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
with SUPERSHARPSILICON tip
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
with SUPERSHARPSILICON tip
detector side: Al-coating
HIGH ASPECT RATIO HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1
HIGH ASPECT RATIO Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
HIGH ASPECT RATIO tip, aspect ratio ≥ 5:1,
detector side: Al-coating
Diamond Coated DIAMOND COATED Sensor,
silicon cantilever for non-contact- /tapping-mode,
long cantilever,
detector side: Al-coating,
tip side: Diamond-coating
1Including datasheet of all probes.
2Including datasheet of up to 32 probes.
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Non-Contact / Tapping-Mode Sensors - special types -
Tip Order-code Probes per set Short description
POINTPROBE PLUS® POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM
,
detector side: Al-coating
SUPERSHARP SILICON SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM
,
with SUPERSHARPSILICON tip
SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for non-contact- /tapping-mode,
for Seiko Instruments AFM
,
with SUPERSHARPSILICON tip
detector side: Al-coating
1Including datasheet of all probes.
2Including datasheet of up to 32 probes.
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Contact Mode Sensors
Tip Order-code Probes per set Short description
uniqprobe™ uniqprobe™ - uniform quality SPM probe for contact mode, 
backside partial Au coating
uniqprobe™ - uniform quality SPM probe for soft contact mode,
backside partial Au coating
uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode,
with 3 different cantilevers, backside partial Au coating

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode,
with 2 different triangular cantilevers, backside partial Au coating

Platinum Silicide SPM-Probe with conductive silicide coating for contact mode
Advanced TEC™ AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for contact mode
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for contact mode
Pt/Ir coating (both sides)
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for contact mode
Au coating (both sides)
POINTPROBE PLUS® POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode
detector side: Al-coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode
detector side: Al-coating
Autoalignment Chip
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode,
short cantilever
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector side: Al-coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode, for Zeiss Veritekt AFM,
detector side: Al-coating3
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for lateral / friction force microscopy,
detector side: Al-coating3
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode,
tip rotated by 180°, detector side: Al-coating3

POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for contact mode
detector side: Pt/Ir-coating,
tip side: Pt/Ir-coating

POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector side: Al-coating
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode,
detector side: Au-coating
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode,
detector and tip side: Au-coating
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector side: Au-coating
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for contact mode, short cantilever,
detector and tip side: Au-coating
Diamond Coated DIAMOND COATED Sensor,
silicon cantilever for contact mode,
detector side: Al-coating
CONDUCTIVE DIAMOND COATED Sensor,
silicon cantilever for contact mode,
detector side: Al-coating
1Including datasheet of all probes.
2Including datasheet of up to 32 probes.
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Sensors for Special Application Modes
Tip Order-code Probes per set Short description
Platinum Silicide SPM-Probe with conductive silicide coating for force modulation mode
Advanced TEC™ AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for force modulation mode
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for force modulation mode
Pt/Ir coating (both sides)
AdvancedTEC™ Silicon-SPM-Sensor,
silicon cantilever for force modulation mode
Au coating (both sides)
POINTPROBE PLUS® POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode,
detector side: Al-coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode,
High quality factor
detector side: Al-coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for force modulation mode,
tip rotated by 180°, detector side: Al-coating3
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Electrostatic Force Microscopy,
detector side: Pt/Ir-coating,
tip side: Pt/Ir-coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
detector side: Al-coating, tip side: hard magnetic coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
Low Moment,
detector side: Al-coating, tip side: hard magnetic coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
Low Coercivity,
detector side: Al-coating, tip side: soft magnetic coating
POINTPROBE-PLUS® Silicon-SPM-Sensor,
silicon cantilever for Magnetic Force Microscopy,
Low Coercivity, high quality factor for UHV applications,
detector side: Al-coating, tip side: soft magnetic coating
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for force modulation mode,
detector side: Au-coating
POINTPROBE®-PLUS Silicon-SPM-Probe,
silicon cantilever for force modulation mode,
detector and tip side: Au-coating
SUPERSHARP SILICON SUPERSHARPSILICON™-SPM-Sensor,
silicon cantilever for high resolution
Magnetic Force Microscopy,
detector side: Al-coating, tip side: hard magnetic coating
SUPERSHARPSILICON™-SPM-Sensor, silicon cantilever for Magnetic Force Microscopy, high quality factor for UHV applications, detector side: Al-coating, tip side: hard magnetic coating
Diamond Coated DIAMOND COATED Sensor,
silicon cantilever for force modulation mode,
detector side: Al-coating
CONDUCTIVE DIAMOND COATED Sensor,
silicon cantilever for force modulation mode,
detector side: Al-coating
1Including datasheet of all probes.
2Including datasheet of up to 32 probes.
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Calibration Standards
Tip Order-code Probes per set Short description
Flatness FLATNESS STANDARD for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10 nm on a 100x100 µm2 area
Lateral CALIBRATION STANDARD for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 200 nm pitch
CALIBRATION STANDARD for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 300 nm pitch
Height
H8 * 1
HEIGHT STANDARD for very precise z-calibration, nominal step height: 8 nm
*Certification available upon request.
For detailed information please click on the order codes to view the respective spec sheet.
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