ALIGN
Alignment Chip
The NANOSENSORS™ alignment chip (ALIGN) is used for a reproducible alignment between NANOSENSORS™ AFM probes and the AFM detection system. The chip has three ridges that fit exactly into corresponding grooves at the backside of each of our AFM probes of our PointProbe® Plus and PointProbe® Plus XY-Alignment Series. (Exception: NANOSENSORS™ AdvancedTEC™ probes). Due to this alignment mechanism the AFM probe can be exchanged with precise repositioning of the tip within 2 µm.
- The probe offers unique features:
- - reproducible positioning
- - easy tip exchange without readjustment of cantilever deflection system
- - fits on all NANOSENSORS™ AFM probes of the PointProbe® Plus
and PointProbe® Plus XY-Alignment Series - - high stability because of a chromium coating
 Sketch Dimensions Alignment Chip with probe of the PointProbe® Series |
 Alignment Chip with AFM Probe |
New! XY-Auto-Alignment
The new XY-auto alignment probes for of the PointProbe® Plus XY-Alignment Series extend the well-known plug-and-fit auto alignment of the Alignment Chip.
In combination with the AFM tips of the PointProbe® Plus XY-Alignment Series and compatible probes, SPM Probes with three different cantilever lengths can be mounted into the Alignment Chip without readjustment of the beam deflection laser. Tip exchange is now possible with a tip repositioning accuracy of better than ± 8 µm in X and Y.
The new XY-auto alignment probes for of the PointProbe® Plus XY-Alignment Series extend the well-known plug-and-fit auto alignment of the Alignment Chip.
In combination with the AFM tips of the PointProbe® Plus XY-Alignment Series and compatible probes, SPM Probes with three different cantilever lengths can be mounted into the Alignment Chip without readjustment of the beam deflection laser. Tip exchange is now possible with a tip repositioning accuracy of better than ± 8 µm in X and Y.
 Sketch Dimensions Alignment Chip with probe of the PointProbe® Plus XY-Alignment Series |
 left: Alignment Chip with alignment ridges; right: AFM probe with alignment grooves on the backside of the holder chip |
Chip data :
| Technical Data | |
|---|---|
| Length over all /µm | 3400 ± 50 |
| Width /µm | 2900 ± 50 |
| Thickness (without probe) /µm | 525 ± 25 |
| Probe position accuracy /µm | ± 2 |
| Technical Data XY Alignment Series | |
| General (any Alignment Chip) | |
| Chip thickness (with mounted probe) /µm | 700 ± 50 |
| Probe projection length (tip position) /µm | 890 ± 50 |
| Repositioning (individual Alignment Chip) | |
| Tip repositioning accuracy (same probe) /µm | ± 2 |
| Tip repositioning accuracy (any probe) /µm | ± 8 |
Order codes and shipping units:
| Order Code | Quantity | Coating |
|---|---|---|
| ALIGN-10 | 10 | Cr |
Please note that SPM probes of the AdvancedTEC™ Series are not equipped with alignment grooves and can not be used in combination with the Alignment Chip.
For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com