uniqprobe™ AFM Tips

uniqprobe™ AFM Tips
uniqprobe™ AFM Tips
  • Small variations of AFM cantilever force constant and resonance frequency 
  • AFM cantilevers made from stress free material leading to absolutely straight AFM cantilevers 
  • Typical AFM tip radius of curvature better than 10nm
  • Reduced drift for SPM and AFM applications in liquid environments
  • Chemically inert
  • High mechanical Q-factor for high sensitivity
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact qp-CONT
YES Contact Mode,
Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
0.1 30
qp-SCONT
YES Soft Contact Mode,
Biological Applications / Soft Contact Measurement,
Lateral / Friction Force Microscopy,
Fluid Tapping / AC Mode
0.01 11
Non-contact qp-BioT
2 cantilevers
YES Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
CB1: 0.3
CB2: 0.08
CB1: 50
CB2: 20
qp-BioAC
3 cantilevers
YES Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
CB1: 0.3
CB2: 0.1
CB3: 0.06
CB1: 90
CB2: 50
CB3: 30
qp-BioAC-CI
3 cantilevers
YES Special tip shape for live cell imaging
Biological Applications / Soft Contact Measurement,
Fluid Tapping / AC Mode
CB1: 0.3
CB2: 0.1
CB3: 0.06
CB1: 90
CB2: 50
CB3: 30
Special qp-fast
3 cantilevers
YES Fast / High Speed Scanning,
Standard Tapping / NC / AC Mode,
Soft Tapping / NC / AC Mode
CB1: 80
CB2: 30
CB3: 15
CB1: 800
CB2: 420
CB3: 250
qp-HBC
YES Scan Asyst®* Peak Force Tapping® 0.5 60

Platinum Silicide AFM Tips

Platinum Silicide AFM Tips
Platinum Silicide AFM Tips
  • Platinum silicide AFM probe with excellent conductivity and good wear-out behavior
  • Typical AFM tip radius 25 nm
  • Alignment grooves on backside of silicon holder chip
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PtSi-CONT
YES Electrostatic Force Microscopy / Electrical Measurement,
Long Lifetime / Hardened AC AFM Probes
0.2 13
Non-contact PtSi-NCH
YES Electrostatic Force Microscopy / Electrical Measurement,
Long Lifetime / Hardened AC AFM Probes
42 330
Special PtSi-FM
YES Electrostatic Force Microscopy / Electrical Measurement,
Long Lifetime / Hardened AC AFM Probes
2.8 75

AdvancedTEC™ AFM Tips

AdvancedTEC™ AFM Tips
AdvancedTEC™ AFM Tips
  • Monolithic silicon AFM probes for very high resolution imaging
  • Fits to all well known AFMs
  • Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
  • Rectangular AFM cantilever with trapezoidal cross section
  • Holder dimensions are 1.6 mm x 3.4 mm
  • REAL AFM TIP VISIBILITY FROM TOP
  • AFM tip height 15-20 µm
  • Typical AFM tip radius of curvature < 10 nm
  • Aspect Ratio of the last 1.5 µm of the AFM tip > 4:1 (from front and side)
  • AFM tip shape is defined by real crystal planes resulting in highly reproducible geometries and extremely smooth surfaces
  • Also available with gold or platinum iridium coating
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact ATEC-CONT
NO Contact Mode 0.2 15
ATEC-CONTAu
YES Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement
0.2 15
ATEC-CONTPt
YES Electrostatic Force Microscopy / Electrical Measurement 0.2 15
Non-contact ATEC-NC
NO Tapping / NC / AC Mode 45 335
ATEC-NCAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
45 335
ATEC-NCPt
YES Electrostatic Force Microscopy / Electrical Measurement 45 335
Special ATEC-FM
NO Force Modulation Mode 2.8 85
ATEC-FMAu
YES Electrostatic Force Microscopy / Electrical Measurement,
Biological Applications
2.8 85
ATEC-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 85

PointProbe® Series AFM Tips

PointProbe® Plus AFM Tips
PointProbe® Plus AFM Tips
  • Monolithic silicon AFM probes for very high resolution imaging
  • Fits to all well-known AFMs
  • Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
  • Rectangular AFM cantilever with trapezoidal cross section
  • Holder dimensions are 1.6 mm x 3.4 mm
  • AFM tip radius typically better than 7 nm
  • Improved consistency and resolution
  • Minimized variation in AFM tip shape
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONT
NO Contact mode 0.2 13
PPP-CONTR
YES Contact mode 0.2 13
PPP-CONTSC
NO Contact mode
(short AFM cantilever)
0.2 25
PPP-CONTSCR
YES Contact mode
(short AFM cantilever)
0.2 25
PPP-XYCONTR
YES Contact mode,
XY-Alignment Compatible
0.2 13
PPP-ZEILR
YES Contact mode
(Seiko or Zeiss Veritect)
1.6 27
Non-contact PPP-NCR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes,
AC160 Mechanical Properties
26 300
PPP-NCH
NO NC/AC/Tapping Mode,
Vacuum AFM Probes
42 330
PPP-NCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
42 330
PPP-NCL
NO NC/AC/Tapping Mode,
Vacuum AFM Probes
(long AFM cantilever)
48 190
PPP-NCLR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
(long AFM cantilever)
48 190
PPP-NCST
NO Soft Tapping / NC / AC Mode 7.4 160
PPP-NCSTR
YES Soft Tapping / NC / AC Mode 7.4 160
PPP-QNCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
(high frequency, high quality factor)
42 330
PPP-SEIHR
YES Soft Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
PPP-XYNCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes,
XY-Alignment Compatible
42 330
PPP-XYNCSTR
YES Soft Tapping / NC / AC Mode,
XY-Alignment Compatible
7.4 160
Special PPP-FM
NO Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-FMR
YES Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-LFMR
YES Contact Mode ,
Lateral / Friction Force Microscopy (LFM)
0.2 23
PPP-QFMR
YES Force Modulation Mode,
Vacuum AFM Probes
(high quality factor)
2.8 75
PointProbe® Plus XY-Alignment AFM Tips
PointProbe® Plus XY-Alignment AFM Tips
  • When used together with the Alignment Chip, AFM probes of three different AFM cantilever lengths (e.g. PPP-NCHR; PPP-XYCONTR and PPP-FMR) can be exchanged without readjustment of the beam deflection laser
  • Monolithic silicon AFM probes for very high resolution imaging
  • Fits to all well-known AFMs
  • Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
  • Rectangular AFM cantilever with trapezoidal cross section
  • AFM tip radius typically better than 7 nm
  • Improved consistency and resolution
  • Minimized variation in AFM tip shape
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTSC
NO Contact mode
(short AFM cantilever)
0.2 25
PPP-CONTSCR
YES Contact mode
(short AFM cantilever)
0.2 25
PPP-CONTSCAuD
YES Contact mode,
Biological Applications / Soft Contact Measurement
(short AFM cantilever)
0.2 25
PPP-XYCONTR
YES Contact mode,
XY-Alignment Compatible
0.2 13
Non-contact PPP-NCL
NO NC/AC/Tapping Mode,
Vacuum AFM Probes
(long AFM cantilever)
48 190
PPP-NCLR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes
(long AFM cantilever)
48 190
PPP-NCLAuD
YES NC/AC/Tapping Mode,
Biological Applications / Soft Contact Measurement
(long AFM cantilever)
48 190
PPP-SEIHR
YES Soft Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
PPP-XYNCHR
YES NC/AC/Tapping Mode,
Vacuum AFM Probes,
XY-Alignment Compatible
42 330
PPP-XYNCSTR
YES Soft Tapping / NC / AC Mode,
XY-Alignment Compatible
7.4 160
Special PPP-FM
NO Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-FMR
YES Force Modulation Mode,
Soft Tapping / NC / AC Mode,
Vacuum AFM Probes
2.8 75
PPP-FMAuD
YES Force Modulation Mode,
Biological Applications
2.8 75
PPP-LFMR
YES Contact Mode ,
Lateral / Friction Force Microscopy (LFM)
0.2 23
PPP-QFMR
YES Force Modulation Mode,
Vacuum AFM Probes
(high quality factor)
2.8 75
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact SSS-NCL
NO Enhanced Resolution Tapping / NC / AC AFM probes
(long cantilever)
48 190
SSS-NCLR
YES Enhanced Resolution Tapping / NC / AC AFM probes
(long cantilever)
48 190
SSS-SEIH
NO Enhanced Resolution Tapping / NC / AC AFM probes
(Seiko or Zeiss Veritect)
15 130
SSS-SEIHR
YES Enhanced Resolution Tapping / NC / AC AFM probes
(Seiko or Zeiss Veritect)
15 130
Special SSS-FM
NO Enhanced Resolution Tapping / NC / AC AFM probes 2.8 75
SSS-FMR
YES Enhanced Resolution Tapping / NC / AC AFM probes 2.8 75
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact AR5-NCLR
YES Trench Measurement
(long AFM cantilever)
48 190
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTSCAu
YES Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement
(short AFM cantilever)
0.2 25
PPP-CONTSCPt
YES Electrostatic Force Microscopy / Electrical Measurement
(short AFM cantilever)
0.2 25
Non-contact CDT-NCLR
YES Electrostatic Force Microscopy / Electrical Measurement
(long AFM cantilever)
72 210
DT-NCLR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
(long AFM cantilever)
72 210
PPP-NCLAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
(long AFM cantilever)
48 190
PPP-NCLPt
YES Electrostatic Force Microscopy / Electrical Measurement
(long AFM cantilever)
48 190
Special CDT-FMR
YES Electrostatic Force Microscopy / Electrical Measurement 6.2 105
DT-FMR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
6.2 105
PPP-FMAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
2.8 75
PPP-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 75
PPP-MFMR
YES Magnetic Force Microscopy 2.8 75
PPP-LC-MFMR
YES Magnetic Force Microscopy
(low coercivity)
2.8 75
PPP-LM-MFMR
YES Magnetic Force Microscopy
(low moment)
2.8 75
PPP-QLC-MFMR
YES Magnetic Force Microscopy
(low coercivity, high quality factor)
2.8 75
SSS-MFMR
YES Magnetic Force Microscopy
(high resolution)
2.8 75
SSS-QMFMR
YES Magnetic Force Microscopy
(high resolution, high quality factor)
2.8 75
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact TL-NCL
NO Tipless Cantilever for Probe Modification
(long cantilever)
48 190
Special TL-FM
NO Tipless Cantilever for Probe Modification 2.8 75
SuperSharpSilicon™  AFM Tips
SuperSharpSilicon™ AFM Tips
  • AFM probes for enhances resolution of micro roughness and nanostructures
  • AFM tip radius is typically better than 2 nm
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact SSS-NCH
NO Enhanced Resolution Tapping / NC / AC Mode
(high frequency)
42 330
SSS-NCHR
YES Enhanced Resolution Tapping / NC / AC Mode
(high frequency)
42 330
SSS-NCL
NO Enhanced Resolution Tapping / NC / AC Mode
(long AFM cantilever)
48 190
SSS-NCLR
YES Enhanced Resolution Tapping / NC / AC Mode
(long AFM cantilever)
48 190
SSS-SEIH
NO Enhanced Resolution Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
SSS-SEIHR
YES Enhanced Resolution Tapping / NC / AC Mode
(Seiko or Zeiss Veritect)
15 130
Special SSS-FM
NO Enhanced Resolution Tapping / NC / AC Mode 2.8 75
SSS-FMR
YES Enhanced Resolution Tapping / NC / AC Mode 2.8 75
SSS-MFMR
YES Magnetic Force Microscopy
(high resolution)
2.8 75
SSS-QMFMR
YES Magnetic Force Microscopy
(high resolution, high quality factor)
2.8 75
High Aspect Ratio AFM Tips
High Aspect Ratio AFM Tips
  • The length of the high aspect portion of the AFM tip is larger than 1.5 µm or 2 µm respectively
  • Special AFM tips are available to compensate the tilt of the scanner-head
  • The AFM tip radii are typically better than 10 nm. We guarantee at least 15 nm
  • The overall AFM tip height is 10 to 15 µm allowing measurements on highly corrugated samples
  • The whole AFM tip as well as the rest of the sensor is fabricated out of one single crystal silicon (monolithic design) resulting in a high lateral stiffness and rigidity
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Non-contact AR10-NCHR
YES Trench Measurement
(high frequency)
42 330
AR10T-NCHR
YES Trench Measurement
(tilt compensated, high frequency)
42 330
AR5-NCH
NO Trench Measurement
(high frequency)
42 330
AR5-NCHR
YES Trench Measurement
(high frequency)
42 330
AR5-NCLR
YES Trench Measurement
(long cantilever)
48 190
AR5T-NCHR
YES Trench Measurement
(tilt compensated, high frequency)
42 330
Rotated AFM Tips
Rotated AFM Tips
  • General data like PointProbe® Plus
  • AFM tip is rotated 180° with respect to the center axis along the AFM cantilever
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-RT-CONTR
YES Contact Mode 0.2 13
Non-contact PPP-RT-NCHR
YES Tapping / NC / AC Mode
(high frequency)
42 330
Special PPP-RT-FMR
YES Force Modulation Mode 2.8 75
Tipless AFM Cantilevers
Tipless AFM Cantilevers
  • no AFM tip
  • highly doped to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact TL-CONT
NO Tipless Cantilever for Probe Modification 0.2 13
Non-contact TL-NCH
NO Tipless Cantilever for Probe Modification
(high frequency)
42 330
TL-NCL
NO Tipless Cantilever for Probe Modification
(long AFM cantilever)
48 190
Special TL-FM
NO Tipless Cantilever for Probe Modification 2.8 75

Plateau AFM Tips

Plateau AFM Tips
Plateau AFM Tips
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]

Coated AFM Tips

Gold Coated AFM Tips
Gold Coated AFM Tips
  • 70 nm thick gold coating on detector side of the AFM cantilever
  • 70 nm thick gold coating on both sides of the AFM cantilever
  • Metallic conductivity of the AFM tip
  • Detector side coating enhances the reflectivity of the laser beam
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact ATEC-CONTAu
YES Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement

0.2 15
Non-contact ATEC-NCAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
45 335
Special ATEC-FMAu
YES Electrostatic Force Microscopy / Electrical Measurement,
Biological Applications
2.8 85
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTAu
YES Contact Mode,
Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement
0.2 13
PPP-CONTAuD
YES Contact Mode,
Biological Applications / Soft Contact Measurement
0.2 13
PPP-CONTSCAu
YES Contact Mode,
Biological Applications / Soft Contact Measurement,
Electrostatic Force Microscopy / Electrical Measurement
(short AFM cantilever)
0.2 25
PPP-CONTSCAuD
YES Contact Mode,
Biological Applications / Soft Contact Measurement
(short AFM cantilever)
0.2 25
Non-contact PPP-NCHAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
(high frequency)
42 330
PPP-NCHAuD
YES Tapping / NC / AC Mode,
Biological Applications
(high frequency)
42 330
PPP-NCLAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
(long AFM cantilever))
48 190
PPP-NCLAuD
YES Tapping / NC / AC Mode,
Biological Applications
(long AFM cantilever)
48 190
PPP-NCSTAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
7.4 160
PPP-NCSTAuD
YES Soft Tapping / NC / AC Mode,
Biological Applications
7.4 160
Special PPP-FMAu
YES Biological Applications,
Electrostatic Force Microscopy / Electrical Measurement
2.8 75
PPP-FMAuD
YES Force Modulation Mode,
Biological Applications
2.8 75
Diamond Coated AFM Tips
Diamond Coated AFM Tips
  • 100 nm thick coating of polycrystalline diamond on the tip side
  • 200 nm thick coating of polycrystalline diamond on the tip side
  • Unsurpassed hardness of the AFM tip
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact CDT-CONTR
YES Electrostatic Force Microscopy / Electrical Measurement 0.5 20
DT-CONTR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
0.5 20
Non-contact CDT-NCHR
YES Electrostatic Force Microscopy / Electrical Measurement
(high frequency)
80 400
DT-NCHR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
(high frequency)
80 400
CDT-NCLR
YES Electrostatic Force Microscopy / Electrical Measurement
(long AFM cantilever)
72 210
DT-NCLR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
(long AFM cantilever)
72 210
Special CDT-FMR
YES Electrostatic Force Microscopy / Electrical Measurement 6.2 105
DT-FMR
YES Long Lifetime / Hardened AC AFM Probes,
Nanoindentation
6.2 105
Platinum-Iridium Coated AFM Tips
Platinum-Iridium Coated AFM Tips
  • 25 nm thick layer of chromium and platinum iridium
  • Coating on both sides of the AFM cantilever
  • Allows electrical measurements
  • Detector side coating enhances the reflectivity of the laser beam by a factor of 2
  • Stress compensated and wear resistant
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact ATEC-CONTPt
YES Electrostatic Force Microscopy / Electrical Measurement 0.2 15
Non-contact ATEC-NCPt
YES Electrostatic Force Microscopy / Electrical Measurement 45 335
Special ATEC-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 85
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact PPP-CONTPt
YES Electrostatic Force Microscopy / Electrical Measurement 0.2 13
PPP-CONTSCPt
YES Electrostatic Force Microscopy / Electrical Measurement
(short cantilever)
0.2 25
Non-contact PPP-NCHPt
YES Electrostatic Force Microscopy / Electrical Measurement
(high frequency)
42 330
PPP-NCLPt
YES Electrostatic Force Microscopy / Electrical Measurement
(long cantilever)
48 190
PPP-NCSTPt
YES Electrostatic Force Microscopy / Electrical Measurement 7.4 160
Special PPP-EFM
YES Electrostatic Force Microscopy / Electrical Measurement 2.8 75
Magnetic Coated AFM Tips
Magnetic Coated AFM Tips
  • Hard magnetic coating on the tip side (coercivity between 0.75 and 300 Oe, remanence magnetization between 80 and 300 emu/cm³)
  • Effective magnetic moment between 2.5 and 13 emu
  • Metallic electrical conductivity
  • Lowest possible guaranteed tip radius of curvature down to < 15 nm
  • Highest possible magnetic resolution better than 25 nm
  • Al coating on detector side of AFM cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Special PPP-MFMR
YES Magnetic Force Microscopy 2.8 75
PPP-LC-MFMR
YES Magnetic Force Microscopy
(low coercivity)
2.8 75
PPP-LM-MFMR
YES Magnetic Force Microscopy
(low moment)
2.8 75
PPP-QLC-MFMR
YES Magnetic Force Microscopy
(low coercivity, high quality factor)
2.8 75
SSS-MFMR
YES Magnetic Force Microscopy
(high resolution)
2.8 75
SSS-QMFMR
YES Magnetic Force Microscopy
(high resolution, high quality factor)
2.8 75

Self-sensing + Self-actuating AFM Probes

Self-sensing + Self-actuating AFM Probes
Self-sensing + Self-actuating AFM Probes

Akiyama-Probe is based on a quartz tuning fork combined with a micromachined AFM cantilever. The great advantage of this novel AFM probe is that one can benefit from both the tuning fork’s extremely stable oscillation and the silicon AFM cantilever’s reasonable spring constant with one AFM probe.
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Special Akiyama-Probe
NO Self-sensing + self-actuating 5 45

Special Developments List

Special Developments List
Special Developments List

Examples of our Special Developments are:

  • Plateau tips with a customized diameter
  • Rounded AFM tips
  • Sphere AFM tips
  • Platinium Iridium or Gold coating with different thicknesses on various AFM probe types
  • Backside Gold and tipside Nitride coating
Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]
Contact Special Developments List (SDL)
NO

Gratings

Gratings
Gratings

In close cooperation with national technical authorities for metrology in Europe, NANOSENSORS™ has developed a set of calibration gratings for SPM applications. These gratings allow the calibration of the X,Y and Z axis of an SPM machine. In addition certain system induced limitations of such apparatus can be revealed and compensated.

Type Reflective coating Application Force constant
[N/m]
Resonance
frequency
[kHz]