SSS-FM

NANOSENSORS™ SSS-FM AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings (SSS-MFMR (link to SSS-MFMR datasheet). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

- guaranteed tip radius of curvature < 5 nm
- typical tip radius of curvature of 2 nm
- typical aspect ratio at 200 nm from tip apex in the order of 4:1
- half cone angle at 200 nm from apex < 10°
- monolithic material
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity

Cantilever data:

Technical Data Nominal Value Specified Range Thickness /µm 3 2.0 - 4.0 Width /µm 30 20 - 35 Length /µm 225 215 - 235 Force Constant /(N/m) 2.8 0.5 – 9.5 Resonance Frequency /kHz 75 45 - 115

Order codes and shipping units:

Order Code	Quantity	Data Sheet	Coating
SSS-FM-10	10	of all probes	without
SSS-FM-20	20	of all probes	without
SSS-FM-50	50	without	without
SSS-FM-W	> 370	of up to 32 probes	without

For further information please contact your local distributor or NANOSENSORS™ directly.
NANOSENSORS™ is a trademark of NanoWorld AG / info@nanosensors.com / www.nanosensors.com