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PointProbe® Plus Rotated Tip Contact Mode - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This AFM probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONTR type is optimized for high sensitivity due to a low force constant.

For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever data:

Property Nominal Value Specified Range
Resonance Frequency /kHz 13 6 - 21
Force Constant /(N/m) 0.2 0.02 - 0.77
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PPP-RT-CONTR-10 10 of all probes reflex
PPP-RT-CONTR-20 20 of all probes reflex
PPP-RT-CONTR-50 50 without reflex

Product screencast NANOSENSORS™ PointProbe® Plus AFM Probes

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NANOSENSORS™ is a trademark of NanoWorld AG / /

NANOSENSORS™ is a trademark of NanoWorld AG - Copyright by NanoWorld AG