The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCSTAuD AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.
A metallic layer (Au) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
|Property||Nominal Value||Specified Range|
|Thickness /µm||2.8||1.8 - 3.8|
|Mean Width /µm||27||19.5 - 34.5|
|Length /µm||150||140 - 160|
|Force Constant /(N/m)||7.4||1.2 - 29|
|Resonance Frequency /kHz||160||75 - 265|
|Order Code||Number of AFM probes per pack||Data sheet||Coating|
|PPP-NCSTAuD-10||10||of all probes||Au (detector side)|