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PPP-FMR

PointProbe® Plus Force Modulation Mode - Reflex Coating

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM probe serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Cantilever data:

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115

Order codes and shipping units:

Order Code Number of AFM probes per pack Data sheet Coating
PPP-FMR-10 10 of all probes reflex
PPP-FMR-20 20 of all probes reflex
PPP-FMR-50 50 without reflex
PPP-FMR-W > 380 of up to 32 probes reflex


Product screencast NANOSENSORS™ PointProbe® Plus AFM Probes

Please watch the new product screencast on NANOSENSORS™ PointProbe® Plus AFM Probes at http://youtu.be/watch?v=oo-NFxKOko8.
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For further information please contact your local distributor or NANOSENSORS™ directly.
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